ABB RED670 Commissioning Manual page 169

Line differential protection
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1MRK 505 378-UUS Rev. J
11.5.3
Instantaneous residual overcurrent protection EFPIOC (50N)
Prepare the IED for verification of settings outlined in Section
Values of the logical signals for EFPIOC are available on the local HMI under Main menu /Tests /
Function status /Current protection /InstResidualOverCurrent(50N,IN>>) /EFPIOC(50N;IN>>):x ,
where x = 1, 2, and 3.
The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI.
To verify the settings the following fault type should be tested:
Phase-to-ground fault
Ensure that the maximum continuous current, supplied from the current source used for the test of the
IED, does not exceed four times the rated current value of the IED.
11.5.3.1
Measuring the trip limit of set values
1.
Inject a phase current into the IED with an initial value below the set value of IN>> and also make
sure that the set value IN>> is in between IN>>Min and IN>>Max.
2.
Increase the injected current in the Ln or in the neutral (summated current input) phase until the
TRIP signal appears.
3.
Disable the fault current
4.
Compare the measured operating current with the set value.
11.5.3.2
Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.5.4
Four step residual overcurrent protection, (Zero sequence or
negative sequence directionality) EF4PTOC (51N/67N)
Prepare the IED for verification of settings outlined in Section
Values of the logical signals for D2PTOC are available on the local HMI under Main menu/Test/
Function status /Current protection/ResidualOverCurr4Step(51N_67N,4(IN>)) /
EF4PTOC(51N_67N;4(IN>)):x, where x = instance number.
The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI.
Line differential protection RED670
Commissioning manual
Do not exceed the maximum permitted overloading of the current circuits in the
IED.
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Testing functionality by secondary injection
"Preparing the IED to verify
"Preparing the IED to verify
Section 11
SEMOD52967-3 v7
settings".
SEMOD52967-11 v9
SEMOD52967-24 v5
SEMOD53296-3 v10
settings".
163

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