Extended Test - EM TEST compact NX5 Series Operation Manual

EM TEST
9.1.3.

Extended Test

The extended menu offers various useful tests for testing and development.
Extended Menu
Voltage iteration stepwise
Voltage change after T by V The test voltage is increased
from V1 to V2 by steps of V after the defined test time T. All
limitations are the same as defined under Quick Start. The
limitation of the max. generated number of spikes is related
to the higher voltage of V1 or V2.
Frequency sweep in one single burst
During one single burst the frequency sweeps from f1 to f2.
For this function the following limitations have to be
respected:
Note: The maximum value for frequency, burst duration td and voltage are in dependence of each other and therefore limited by the
generator performance. The practical limits of the UCS500N7 are 20kHz for f2 and 50ms for the burst duration td. The limits of the
generator model compact NX5 N5 are approx. 10 times higher.
Frequency sweep with a constant duration after T by f
The spike frequency is increased from f1 to f2 by steps of f
after the defined test time T. All limitations are the same as
defined under Quick Start. The limitation of the max.
generated number of spikes is related to the higher
frequency of f1 or f2.
Frequency sweep with a constant pulse numbers
The burst duration is increased from td1 to td2 by steps of 
td after the defined test time T. All limitations are the same
as defined under Quick Start. The limitation of the max.
generated number of spikes is related to the higher duration
of td1 or td2.
Operating Manual
Tr
f1
Td
Td
tr -td
V 1.06
Compact NX5
>= 100 ms
<= f2
>= 5.0 ms
>= 5 / f1
>= 50 ms
81 / 143