Mitsubishi MELSEC Q series User Manual page 64

(1) Specification period
Select conditions treated as the specification period from the following items.
Setting item
Condition
Device
specification
(a) Conditions of the specified period
Whether the specified conditions are met is judged in the END processing of each scan. When the conditions
are met in the END processing, data are sampled for a specified period or at a specified timing until the
conditions are not met in the subsequent END processing.
Conditions
Scan time
Program 0
Data collection
Sampling
(1) Even when the conditions are not met, data can be sampled until the judgment whether the conditions are met is made in the END
processing.
(2) Even when the conditions are met, data cannot be sampled until the judgment whether the conditions are met is made in the END
processing.
(3) Even when the conditions are not met, data are sampled because the data sampling is possible during this period.
(4) Data are not sampled because the data sampling is not possible during this period.
(5) Even when the conditions are met, data are not sampled because the data sampling is not possible during this period.
(b) Condition specification
When the conditions of the specified device are met, data are sampled for a specified period or at a specified
timing. Select the setting from the following.
• When the bit device is on: Data are sampled while the specified device is on.
• When the bit device is off: Data are sampled while the specified device is off.
• When the word device value meets the specified value: Data are sampled when the current value of the
specified device is equal to the condition value.
The following devices can be specified as device data conditions.
Type
X, Y, M, L, F, SM, V, B, SB, T (contact)
Bit device
Bit specification of word device: D, D (extended data register), SD, W, W (extended link register), SW, R, ZR, FD
Word device T (current value), ST (current value), C (current value), D, D (extended data register), SD, W, W (extended link register), SW, R, ZR, FD
*1 T (contact), ST (contact), and C (contact) are specified with TS, SS, and CS respectively.
For the above devices, index modification and indirect specification are not available.
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When the bit device is on
When the bit device is off
When the word device value meets the
specified value
Met Met
(1)
Scan time
END 0 END
END processing END processing END processing END processing
Possible Possible
Sampling
(3)
*1
, ST (contact)
Data are sampled while the specified device is on.
Data are sampled while the specified device is off.
Data are sampled while the current value of the specified device is equal to the
condition value.
Not met Not met
Scan time Scan time
0 END 0
END processing END processing
Not possible Not possible
(4)
Description
*1 *1
, C (contact) , FX, FY
Description
Met Met
(2)
Scan time
END 0 END
END processing END processing END processing
Possible Possible
Sampling
(5)