Test Features; Ieee Std. 1149.1 Implementation; Test Access Port (Tap) Interface Signals - Motorola MC92603 Reference Manual

Chapter 6

Test Features

This chapter consists of the following sections:
• Section 6.1, "IEEE Std. 1149.1 Implementation"
• Section 6.2, "System Accessible Test Modes"
• Section 6.3, "BIST Sequence Test with Internal Digital Loopback Mode"
The MC92603 supports several test modes for built-in system test, BIST, and production
testing. The MC92603 also has an IEEE Std. 1149.1 [3] compliant test access port and
boundary scan architecture implementations. This chapter covers the JTAG
implementation and the system accessible test modes.
6.1

IEEE Std. 1149.1 Implementation

This section describes the IEEE Std. 1149.1 compliant test access port and boundary scan
architecture implementation in the MC92603.
6.1.1

Test Access Port (TAP) Interface Signals

Table 6-1 lists the interface signals for the TAP.
Signal
Name
TCK Test clock
TMS Test mode select
TDI Test data in
TRST Test reset bar
TDO Test data out
MOTOROLA
Table 6-1. TAP Interface Signals
Description
Test logic clock
TAP mode control input
Serial test instruction/data input
Asynchronous test controller reset
Serial test instruction/data output
Chapter 6. Test Features
Function
Active
Direction
State
Input —
Input —
Input —
Input Low
Output —
6-1