Detail Of Each Test Function - Toshiba TECRA A11 Series Maintenance Manual

3.35.6 Detail of Each Test Function

3.35.6.1 System Test
1) DMI data read
This subtest displays the information in the Flash-ROM in the following format
3.35.6.2 Memory test
1) Conventional memory test
This subtest writes a constant data to conventional memory (0 to 640 KB), then reads the
new data and compares the result with the original data.
With regard to the test memory content, save the data to the test memory before the test and
restore it after the test.
Details of Test:
1-1) This subtest performs a test data write/read/compare operation to the work memory
(640KB from 0000:0000 to 9000:FFFF) in the real mode. The test procedure is as follows:
Step 1: Byte Enable Test
Write double words of the data to the initial address of the data in 64KB units and the initial
address + 4, then read the written data byte by byte and compare the result with the original
data.
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TECRA A11/S11/P11/Satellite Pro S500 Series Maintenance Manual (960-784) [CONFIDENTIAL] 3-157
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Tests and Diagnostics