National Instruments 653 Series User Manual page 96

For traditional ni-daq. high-speed digital i/o devices for pci, pxi, compactpci, at, eisa, and pcmcia bus systems
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Note
Random vibration profiles were developed in accordance with MIL-T-28800E and
MIL-STD-810E Method 514. Test levels exceed those recommended in MIL-STD-810E
for Category 1 (Basic Transportation, Figures 514.4-1 through 514.4-3).
© National Instruments Corporation
Functional shock .................................... MIL-T-28800 E Class 3
Operational random vibration
(PXI only) .............................................. 5 to 500 Hz, 0.31 g
Nonoperational random vibration
(PXI only) .............................................. 5 to 500 Hz, 2.5 g
(per Section 4.5.5.4.1)
Half-sine shock pulse, 11 ms
duration, 30 g peak, 30 shocks
per face
A-5
Appendix A
Specifications
, 3 axes
rms
, 3 axes
rms
NI 653X User Manual

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