Agilent Technologies 81250 System Programming Manual And Scpi Reference page 40

Example Programs
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March 2006
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:_TEST:SGEN:GLOB:MUX 1
:_TEST:SGEN:PDAT:APP "INPUT_PORT", 4, "AddrBus"
:_TEST:SGEN:PDAT1:TERM5:APP "Addr4", 5
:_TEST:SGEN:CONN:PDAT1:TERM1:TO (@0102001)
:_TEST:SGEN:PDAT1:TERM1:PULS:WIDT 20e-9
:_TEST:SGEN:PDAT1:TERM1:PULS:DEL 5e-9
:_TEST:SGEN:PDAT1:TERM1:PULS:TRANS 1e-9
:_TEST:SGEN:PDAT1:TERM1:VOLT:HIGH 3
:_TEST:SGEN:PDAT1:TERM1:VOLT:LOW 1
:_TEST:SGEN:PDAT1:TERM1:OUTP:IMP:EXT 50
:DVT:INST:HAND:DEST _TEST
Overview of the SCPI Command Structure
# set system BLG factor, check that
# period and memory depth match:
# set an input data port named
# AddrBus with 4 Terminals:
# add a 5th terminal with name
Addr4:
# connect terminal 1 of port AddrBus
# to connector 1 of module 2:
#set pulse width of terminal 1 (T1):
# set delay of T1:
# set leading edge of T1:
# set high level of T1:
# High level has to be higher than
# the actual low level.
# set low level of T1:
# set load impedance for T1:
# When the virtual device is no
# longer required, the handle can be
# eliminated:
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