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81250
Agilent Technologies 81250 Manuals
Manuals and User Guides for Agilent Technologies 81250. We have
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Agilent Technologies 81250 manuals available for free PDF download: System Programming Manual And Scpi Reference, Installation Manual, User Manual
Agilent Technologies
81250
System Programming Manual And Scpi Reference
Agilent Technologies 81250 System Programming Manual And Scpi Reference (377 pages)
Parallel Bit Error Ratio Tester
Brand:
Agilent Technologies
| Category:
Test Equipment
| Size: 1.81 MB
Table of Contents
Table of Contents
4
Programming Interfaces
20
Programming Models
21
Agilent 81250 String Interface Library
23
Error Handling
24
Connect_Hp81200
24
Call_Hp81200
25
Geterrstr_Hp81200
26
Disconnect_Hp81200
26
Example Implementations
27
Command Line Interface
29
Overview of the SCPI Command Structure
30
Command Syntax
31
Hierarchical Structure
31
Conventions Used in the Command Reference
31
Instrument Commands and Queries Syntax
32
Linking Commands
32
The Command Tree
33
DVT Subsystem and Virtual Instruments
34
Multiple Parameter Access
35
Example Programs
38
Typical SCPI Programming Sequence
39
Example C++ Program
41
SCPI Commands Overview
44
Generic Administration Commands
45
Virtual Instruments Administration Commands
45
Mass Memory Commands
46
Segment Editing Commands
47
Global Commands
49
Clock Reference Input Commands
50
External Input Commands
51
Trigger Output Commands
51
Port Administration Commands
52
Terminal Administration Commands
53
Connector Administration Commands
53
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
53
Clockgroup Administration Commands
54
Sequence Commands
54
Synchronization Commands
55
Analyzer Commands
56
Level Parameter Commands
56
Amplitude/Offset Correction Factor Commands
57
Timing Parameter Commands
58
MUX Parameter Commands
59
Demux Parameter Commands
60
Demux Rewiring Commands
60
Delay Control Parameter Commands
61
Input Parameter Commands
61
Optical Input Commands
63
Output Parameter Commands
64
Optical Output Commands
65
Clock Trigger Output Commands
66
Auxiliary out Commands
66
Performance Parameter Commands
67
Format Parameter Commands
67
Commands in the DVT Subsystem
68
Example: Use of :DVT Subsystem Commands
69
Top-Level Commands
70
Dvt:idn
70
System Subsystem
71
Dvt:system:error
71
Instrument Subsystem
72
Dvt:instrument:list
72
Dvt:instrument:resource:list
72
Instrument:handle Subsystem
73
Dvt:instrument:handle:create
73
Dvt:instrument:handle:list
74
Dvt:instrument:handle:destroy
74
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
75
Dvt:mmemory:setting:import
76
Commands in DSR Application Subsystems
78
Administration Commands
79
System Subsystem
80
Handle>:System:cinformation
81
Handle>:System:test:module
82
Handle>:System:test:global
83
Handle>:System:mqueue[:Read]
84
System:client Subsystem
85
Handle>:System:client:block
86
Configuration Subsystem
87
Handle>:Configuration:stypes
88
Handle>:Configuration:profile[:Value]
89
Handle>:Configuration:profile:list
90
Mmemory Subsystem
91
Handle>:Mmemory:information
92
Handle>:Mmemory:segment:load
93
Handle>:Mmemory:segment:save
94
Handle>:Mmemory:segment:get
95
Handle>:Mmemory:setting:load
96
Handle>:Mmemory:setting:new
97
Edit:segment(*) Subsystem
98
Handle>:Edit:segment:open
99
Handle>:Edit:segment(*):Save
100
Handle>:Edit:segment(*):Delete
101
Handle>:Edit:segment(*):Exists
102
Handle>:Edit:segment(*):Rpath
103
Handle>:Edit:segment(*):Close
104
Handle>:Edit:segment(*):Pattern:data
105
Handle>:Edit:segment(*):Pattern:coding
107
Handle>:Edit:segment(*):Pattern:coding
108
Handle>:Edit:segment(*):Pattern:error:first
109
Handle>:Edit:segment(*):Pattern:find:first
112
Handle>:Edit:segment(*):Pattern:length
113
Handle>:Edit:segment(*):Pattern:modify:copy
114
Handle>:Edit:segment(*):Pattern:modify:fill
115
Handle>:Edit:segment(*):Pattern:modify:invert
116
Handle>:Edit:segment(*):Pattern:modify:mirror
117
Handle>:Edit:segment(*):Pattern:modify:insert
118
Handle>:Edit:segment(*):Pattern:modify:converse
119
Handle>:Edit:segment(*):Pattern:modify:serialize
120
Handle>:Edit:segment(*):Pattern:modify:deserialize
121
Handle>:Edit:segment(*):Parameter:list
122
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
123
Handle>:Edit:segment(*):Type
124
Handle>[:Cgroup(*)]:Cinformation
125
Cgroup(*)]:Mclock Subsystem
126
Cgroup(*)]:Module(*) Subsystem
127
Handle>[:Cgroup(*)]:Module(*):Type
128
Handle>[:Cgroup(*)]:Module(*):Cnames
129
Cgroup(*)]:Module(*):Connector(*) Subsystem
130
Handle>[:Cgroup(*)]:Module(*):Connector(*):Type
131
State
133
State
134
Cgroup(*)][:Source]:Trigger Subsystem
135
Handle>[:Cgroup(*)][:Source]:Trigger:mux
136
Handle>[:Cgroup(*)][:Source]:Trigger:output[:State]
137
Handle>[:Cgroup(*)][:Source]:Trigger:tvoltage
138
Handle>[:Cgroup(*)][:Source]:Trigger:tvoltage
139
Handle>[:Cgroup(*)][:Source]:Trigger:mode
140
Sgeneral Subsystem
141
Sgeneral:information Subsystem
142
Sgeneral:global Subsystem
143
Handle>:Sgeneral:global:calibration:puse Passive
144
Handle>:Sgeneral:global:doffset
145
Handle>:Sgeneral:global:period
146
Handle>:Sgeneral:global:mux
147
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
148
Handle>:Sgeneral:global:pll:dstate
150
Handle>:Sgeneral:global:pll:state
151
Sgeneral:global:configure Subsystem
152
Handle>:Sgeneral:global:configure[:Ecount]
153
Handle>:Sgeneral:global:configure:ccapture
154
Sgeneral:global:initiate:continuous Subsystem
155
Sgeneral:global:system Subsystem
156
Sgeneral:global:sequence Subsystem
157
Handle>:Sgeneral:global:sequence[:Value]
158
Handle>:Sgeneral:global:sequence[:Value]
162
Handle>:Sgeneral:global:sequence:events
163
Handle>:Sgeneral:global:sequence:events
165
Handle>:Sgeneral:global:sequence:force
166
Handle>:Sgeneral:global:sequence:pcontrol
167
Sgeneral:global:synchronization Subsystem
168
Handle>:Sgeneral:global:synchronization:used
169
Handle>:Sgeneral:global:synchronization:smode
170
Handle>:Sgeneral:global:synchronization:smode
171
Handle>:Sgeneral:global:synchronization:apselect
172
Handle>:Sgeneral:global:synchronization:paccuracy
173
Sgeneral:global:trigger Subsystem
174
Sgeneral:global:arm Subsystem
180
Handle>:Sgeneral:global:arm
182
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
183
Timing Parameter Commands
185
Pulse:delay
186
Pulse:delay
187
Pulse:delay:cycles
188
Pulse:delay:time
189
Pulse:crossing
190
Pulse:crossing
191
Pulse:width
192
Pulse:dcycle
193
Pulse:hold
194
Pulse:transition[:Leading]
195
Pulse:transition[:Leading]
196
Pulse:transition:trailing
197
Pulse:transition:caconfiguration[:Leading]
198
Pulse:transition:caconfiguration[:Leading]
199
Pulse:transition:caconfiguration:trailing
200
Pulse:transition:caconfiguration:trailing
201
Parameter Commands for MUX and DEMUX Modules
203
Voltage:amplitude
207
Voltage:offset
208
Voltage:offset:enable
209
Output:eattenuator
210
Output:delay:sweep
211
Output:delay:sweep
212
Output:delay:sweep:mode
213
Output:delay:sweep:prom
214
Input:ocompensation
215
Trigger
216
Trigger:mode
217
Demux Rewiring Parameter Commands
218
Handle>:Sgeneral:pdata:dmux:stage
223
Handle>:Sgeneral:pdata:dmux:stage
224
Level Parameter Commands
226
Voltage[:Level][:Immediate]:High
227
Voltage[:Level][:Immediate]:Low
228
Voltage[:Level][:Immediate]:Low
229
Voltage[:Level][:Immediate]:Caconfiguration:low
230
Voltage[:Level][:Immediate]:Caconfiguration:low
231
Voltage[:Level][:Immediate]:Semode
232
Voltage[:Level][:Immediate]:Semode
233
Sense:voltage:range
234
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
235
Calibration[:Voltage]:Ocfactor
236
Calibration[:Voltage]:Acfactor
237
Calibration[:Voltage]:Hold
238
Delay Control Parameter Commands
240
Dcontrol:sensitivity
241
Dcontrol:source
242
Dcontrol:source
243
Dcontrol:state
244
Dcontrol:state
245
Input Parameter Commands
246
Input:polarity
247
Input:type
248
Input:type
249
Input:mode
250
Input:tvoltage
251
Input:threshold
252
Input:impedance[:Internal]
253
Input:sequence:[Layer:source:]Clock
254
Input:serial
255
Input:delay
256
Input:delay:cycles
257
Input:delay:time
258
Input:delay:actual
259
Input:delay:sweep
260
Input:tconfig
261
Input:tconfig
262
Input:dimpedance
263
Input:disconnect:mode
264
Input:optic[:State][:Value]
265
Input:optic:power:unit[:Value]
266
Input:optic:power:threshold[:Value]
267
Input:optic:wavelength[:Value]
268
Output Parameter Commands
269
Output[:State]
270
Output:polarity
271
Output:cstate
272
Output:tvoltage
273
Output:impedance:external
274
Output:tconfig
275
Output:tconfig
276
Output:dimpedance:external
277
Output:caconfiguration[:Mode]
278
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
279
Output:disconnect:mode
280
Optical Output Commands
281
Output:optic[:State][:Value]
282
Output:optic[:State][:Value]
283
Output:optic:method[:Value]
284
Output:optic:power:unit[:Value]
285
Output:optic:power:average[:Value]
286
Output:optic:power:mamplitude[:Value]
287
Output:optic:power:mamplitude[:Value]
288
Output:optic:power:high[:Value]
289
Output:optic:power:low[:Value]
290
Output:optic:eratio[:Value]
291
Output:optic:eratio:unit[:Value]
292
Clock Output Commands
293
Clock[:Source]:Voltage[:Level][:Immediate]:Low
294
Clock[:Source]:Pulse:delay:sweep
295
Clock:output:dimpedance:external
296
Clock:output:tconfig
297
Clock:output:tconfig
298
Clock:output:tvoltage
299
Aout[:Monitor]
300
Port Administration Commands
301
List
302
Rename
303
Type
304
Species
305
Terminal Administration Commands
306
Delete
307
Name
308
Calibration:cdelay
309
Connector Administration Commands
310
Terminal(*):[To]
311
Terminal(*):[To]
312
Error Analysis Commands
313
Ecount:reset
316
Clock Mode Commands
317
Signal:mode
318
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
319
Format
320
The Language Syntax
323
Name Construct
324
Statepar Construct
325
Vector Width Construct
326
Parameter Construct
327
Scopes
329
Vector Padding and Clipping
331
Parameter Segments
332
Default Settings
334
Example: Memory Type Segment
335
Example: PRWS Type Segment
336
Main.cpp Application Code Using VXI Plug&Play
339
Lib.cpp Interface Class Library Code
352
Main.cpp Application Code
357
Agilent 81250 Parallel Bit Error Ratio Tester, Programming Reference, March
358
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Agilent Technologies 81250 Installation Manual (146 pages)
Parallel Bit Error Ratio Tester
Brand:
Agilent Technologies
| Category:
Test Equipment
| Size: 3.92 MB
Table of Contents
Table of Contents
3
1 About this Manual
7
Welcome to the Parbert Installation Guide
8
General Structure of the Installation Guide
8
How to Use this Guide
9
Document History
11
2 Introduction
13
Parbert Components Overview
13
The Parbert Controller PC
14
The Parbert Mainframes
15
The Parbert Modules
16
About Parbert Systems
23
Parbert Software Components
26
Prerequisites
27
Power Supply
27
Environment
27
Controller PC Requirements
28
Tools
28
Unpacking Parbert
29
3 Setting up the Parbert Controller PC
31
Setting up a Preconfigured Controller PC
31
Quick Check
32
Configuration of the Operating System
32
Setting up a Custom Controller PC
33
Installing the Agilent I/O Libraries
34
Installing the Interface Cards
35
Enabling the Interfaces
36
4 Connecting Mainframes to the Controller PC
37
Checking the Mainframe Clock Distribution
38
Connecting the Master Mainframe
40
Connecting Expander Mainframes
41
Interconnecting Slave Mainframes
42
Positioning the Mainframes
43
Installing the Synchronization Cable in a Slave
44
Connecting the Synchronization Cables to the Master
45
Connecting the Clock Reference Cables
47
Connecting the Giga Clock
49
5 Putting Parbert into Operation
51
How to Configure the IEEE 1394 and GPIB Interfaces
52
How to Install the Parbert User Software
56
How to Use the Agilent 81250 Config Tool
57
How to Configure I/O Interfaces and Systems
59
How to Check the Configuration and Serial Numbers
62
How to Specify Startup Settings
64
How to Configure SICL/LAN Interfaces
67
Starting the Parbert User Software
68
How to Select the Firmware Server
70
How to Select the System
71
How to Specify a Start Setting
72
How to Disable the UI Configuration Dialog
73
How to Get Help
74
Testing Parbert's Integrity
75
6 Changing the Parbert Hardware
79
Removing a Module
80
How to Disconnect the Module Cables
80
How to Plug out the Module
81
Installing a Module
82
How to Set the Logical Address
83
How to Plug in the Module
85
How to Connect the Module
86
How to Open a Module
90
Adding or Changing Frontends
91
How to Remove a Frontend
93
How to Install a Frontend
96
Installing the Trigger Input Pod
98
How to Proceed after Changing the Hardware
100
7 Special Parbert Systems
101
Installing Parbert 43/45G Systems
101
Components of Parbert 43/45G Systems
102
Setting up Parbert 43/45G Systems
104
Converting Parbert 43/45G to a Basic Parbert
106
Parbert 43/45G Extensions
109
Making Clock Connections
111
Installing Optical Modules
114
Laser Safety Information
114
Installing E4810A/E4811A Electrical-Optical Modules
116
Installing E4882A O/E and E4883A E/O Converter Modules7-19
119
Installing the 10.8 Gbit/S Booster Module
121
Expanding Systems with Embedded Controller
123
8 Troubleshooting the Parbert Installation
127
Problems at the Power-On Selftest
127
Problems after Changing the Hardware
128
Problems with Clockgroups
130
9 Controlling Parbert Remotely
133
Controlling Parbert Via GPIB
133
Controlling Parbert Via LAN
135
Appendix
137
Declaration of Conformity
138
Site Attenuation Requirements
140
Agilent Technologies 81250 User Manual (32 pages)
ParBERT SONET/SDH Frame Generator
Brand:
Agilent Technologies
| Category:
Test Equipment
| Size: 0.3 MB
Table of Contents
Table of Contents
3
Introduction to the Frame Generator
5
Using the Frame Generator
7
Generating Frame Files
8
Importing Frames into Parbert
9
Selecting the Files to be Generated
11
Converting Frame Files
12
How Frames Are Generated
13
How the Frame Generator Works
13
BIP Coding
14
Payload Details
15
SONET Path Overhead and SDH HP Overhead Details
16
SONET Line Overhead and SDH MS Overhead Details
17
SONET Section Overhead and SDH RS Overhead Details
18
CMI Coding
20
Synchronizing Pattern
20
Settings Area
24
Menus
27
File Menu
27
View Menu
28
Help Menu
28
Tool Bar
28
Status Bar
29
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