Test Section 5; Data Pattern Test - HP Series 37 Reference Manual

Test Descriptions
3.5 TEST SECTION 5
Data Pattern Test
Step 51. Data Pattern Test -- This step writes 64K data patterns into one 32-bit memory word in each
block. This function attempts to access each chip on each board in order to point out any
malfunctioning chips. The data patterns are generated by using the 64K possible patterns in the
lower 16 bits and the one's complement of the pattern in the upper 16 bits.
SEP 84
3-8
The following message will be displayed during test execution:
Begin Section 5
Begin Step 51
Test is half way to completion
Step 51 completed
End of Section 5
The following error message will be displayed only if error correction is NOT working:
Expected: %XXXXXX XXXXXX; Received:
'f,YYYYYY yyyvYY
Address =
'f,zzzzzz
Bank = W
Board = A
Where: XXXXXXXXXXX
c
data expected in octal
YYYYYYYYYYY
=
data received in octal
ZZZZZZ
=
address of error in octal 0 <
=
Z <
=
I 77777
W
=
bank with error 0 <
=
W <
=
31
A
=
0/1
The error latch information is displayed if an error was detected during the test Bad memory
chips are identified only by the error latch information.
Single-bit error detected
Board: X
Syndrome Code:
'f,VYV
Chip Number: UZZZZ
Where: X = 0/ I
YYY = octal syndrome code
UZZZZ = Reference Designator of faulty RAM