Die Voltage Validation; Vcc Overshoot - Intel CORE 2 DUO E4000 - DATASHEET 3-2008 Datasheet

2.6.3 V Overshoot
CC
The processor can tolerate short transient overshoot events where V
voltage when transitioning from a high to low current load condition. This overshoot
cannot exceed VID + V
The time duration of the overshoot event must not exceed T
maximum allowable time duration above VID). These specifications apply to the
processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands.
Table 7. V Overshoot Specifications
CC
Symbol
V
OS_MAX
T
OS_MAX
NOTES:
1. Adherence to these specifications is required to ensure reliable processor operation.
Figure 2. V Overshoot Example Waveform
CC
VID + 0.050
VID - 0.000
NOTES:
1. V
OS
2. T
OS
2.6.4

Die Voltage Validation

Overshoot events on processor must meet the specifications in
across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are < 10 ns in
duration may be ignored. These measurements of processor die level overshoot must
be taken with a bandwidth limited oscilloscope set to a greater than or equal to
100 MHz bandwidth limit.
24
(V
OS_MAX OS_MAX
Parameter
Magnitude of V overshoot above VID
CC
Time duration of V overshoot above VID
CC
Example Overshoot Waveform
0 5
T
V
is measured overshoot voltage.
is measured time duration above VID.
is the maximum allowable overshoot voltage).
Min
—
—
T
OS
10 15
Time [us]
: Overshoot time above VID
OS
: Overshoot above VID
OS
Electrical Specifications
exceeds the VID
CC
(T is the
OS_MAX OS_MAX
Max Unit Figure Notes
1
50 mV 2
1
25 μs 2
V
OS
20
Table 7 when measured
Datasheet
25