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3 PRODUCT DESCRIPTION
3.7.6
Aperture-specific parameters – SUPERSCAN IV-15
3.7.6.1
Mechanical specifications
Mirror substrate
Input aperture [mm]
Beam displacement [mm]
Weight without objective [kg]
Dimension (L x W x H) [mm]
3.7.6.2
Dynamic behaviour
Mirror substrate
Tuning
1
Processing speed at 30 V [rad/s]
Processing speed at 48 V [rad/s]
Positioning speed at 30 V [rad/s]
Positioning speed at 48 V [rad/s]
Tracking error [ms]
Step response time at 1 % of full scale [ms]
Position noise (RMS) [µrad]
1) VC - Optimized tuning for a wide range of applications with emphasis on processing speed.
W - Optimized tuning for long vectors at highest speeds and precise beam deflection.
C - Optimized tuning for long vectors at highest speeds.
PL - Optimized tuning for long vectors with high marking speed and very precise beam deflection.
H - Optimized tuning for high precision beam deflection and fastest beam direction change during hatching.
2) Calculation of the speed in the working field: Focal length F-Theta lens × speed.
Example: Deflection unit with F-Theta lens f = 254 mm, speed 30 rad/s
=> 254/1000 × 30 = 7.6 m/s.
3) Controlled to 1/5,000 of full scale.
4) Calculation of acceleration time approx. 1.9 × tracking error.
5) Calculation of acceleration time approx. 2.3 × tracking error.
6) Calculation of acceleration time approx. 2.4 × tracking error.
7) Calculation of acceleration time approx. 2.6 × tracking error.
© 2022 RAYLASE GmbH SUPERSCAN IV
QU - Fused
SI - Silicon
silica
15
18.1
18.1
approx. 3.2
170 × 125 × 117.5
QU - Fused
SI - Silicon
silica
VC
W/ C VC
45
-
50
50
200
65
45
-
50
2
50
200
65
2
0.19
4
0.30
5
0.16
3
0.49 0.65 0.43
< 4.5
MN105-en / v1.0.12
SC - Silicon carbide
18.0
SC - Silicon carbide
VC
PL
W
55
-
-
75
110
200
55
-
-
75
110
200
4
0.14
4
0.30
7
0.20
0.37
0.80
0.50
H
30
30
30
30
6
0.12
4
0.47
23
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