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1MRK 511 409-UUS Rev. K
For information about the functions to test, for example signal or parameter names, see the technical
manual. The correct initiation of the disturbance recorder is made on pickup and/or release or trip from a
function. Also check that the wanted recordings of analog (real and calculated) and binary signals are
achieved.
During testing, observe that the right testing method, that corresponds to the actual parameters set in the
activated parameter setting group, is used.
Set and configure the function(s) before testing. Most functions are highly flexible and permit a choice of
functional and tripping modes. The various modes are checked at the factory as part of the design
verification. In certain cases, only modes with a high probability of coming into operation need to be
checked when commissioned to verify the configuration and settings.
10.2
Activating the test mode
Put the IED into the test mode before testing. The test mode blocks all protection functions and some of
the control functions in the IED, and the individual functions to be tested can be unblocked to prevent
unwanted operation caused by other functions. In this way, it is possible to test slower back-up
measuring functions without the interference from faster measuring functions. The test switch should
then be connected to the IED.Test mode is indicated when the yellow PickupLED flashes.
It is important that the IED function to be tested is put into test mode, even if the MU is sending data
marked as "test". The IED will interpret these data as valid if it is not in test mode.
1.
Browse to the TESTMODE menu and press E.
The TESTMODE menu is found on the local HMI under Main menu /Test/IED test mode /
TESTMODE
2.
Use the up and down arrows to choose Enabled and press E.
3.
Press the left arrow to exit the menu.
The dialog box Save changes appears.
4.
Choose Yes, press E and exit the menu.
The yellow pickupLED above the LCD will start flashing when the IED is in test mode.
10.3
Preparing the connection to the test equipment
The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24 or FT. The test switch
and its associated test plug handles are a part of the COMBITEST or FT system of Hitachi Power grids,
which provides secure and convenient testing of the IED.
When using the COMBITEST, preparations for testing are automatically carried out in the proper
sequence, that is, for example, blocking of tripping circuits, short circuiting of CTs, opening of voltage
circuits, making IED terminals available for secondary injection. Terminals 1 and 8, 1 and 18 as well as 1
and 12 of the test switches RTXP8, RTXP18 and RTXP24 respectively are not disconnected as they
supply DC power to the protection IED. When FT switch is used for testing, care shall be exercised to
open the tripping circuit, ahead of manipulating the CT fingers.
Phasor measurement unit RES670
Commissioning manual
Parameters can be entered into different setting groups. Make sure to test functions for
the same parameter setting group. If needed, repeat the tests for all different setting
groups used. The difference between testing the first parameter setting group and the
remaining is that there is no need for testing the connections.
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Section 10
Testing IED operation
M11412-2 v15
M11743-2 v9
69
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