Table 173 Selective Self-Test Log Data Structure; Table 174 Selective Self-Test Feature Flags - Hitachi CinemaStar P7K500 Specifications

10.43.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to
select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the
contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures
follow the ATA/ATAPI-7 specifications for byte ordering.
Description
Data structure revision
Starting LBA for test span 1
Ending LBA for test span 1
Starting LBA for test span 2
Ending LBA for test span 2
Starting LBA for test span 3
Ending LBA for test span 3
Starting LBA for test span 4
Ending LBA for test span 4
Starting LBA for test span 5
Ending LBA for test span 5
Reserved
Vendor specific
Current LBA under test
Current span under test
Feature flags
Vendor specific
Selective self-test pending time
Reserved
Data structure checksum

Table 173 Selective self-test log data structure

10.43.7.1
Feature flags
The Feature flags define the features of Selective self-test to be executed.
Bit Description
0 Vendor specific
1 When set to one, perform off-line scan after selective test.
2 Vendor specific
3 When set to one, off-line scan after selective test is pending.
4 When set to one, off-line scan after selective test is active.
5-15 Reserved.

Table 174 Selective self-test feature flags

HITACHI Deskstar & CinemaStar P7K500 Hard Disk Drive specification (Rev 1.1)
Bytes Offset
2 00h
8 02h
8 0Ah
8 12h
8 1Ah
8 22h
8 2Ah
8 32h
8 3Ah
8 42h
8 4Ah
256 52h
154 152h
8 1Ech
2 1F4h
2 1F6h
4 1F8h
2 1FCh
1 1Feh
1 1FFh
512
231
Read/Write
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
Reserved
Vendor specific
Read
Read
R/W
Vendor specific
R/W
Reserved
R/W