Self-Test Log Data Structure; Selective Self-Test Log Data Structure; Table 109: Self-Test Log Data Structure - Hitachi HTS541010G9AT00 - Travelstar 100 GB Hard Drive Specifications

x1h Sleep
x2h Standby
x3h Active/Idle
x4h S.M.A.R.T. Off-line or Self-test
x5h-xAh Reserved
xBh-xFh Vendor specific
Note: The value of x is vendor specific

12.38.6 Self-test log data structure

The following defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these data
structures follow the ATA/ATAPI-6 specifications for byte ordering.

Table 109: Self-test log data structure

Description
Data structure revision
Self-test number
Self-test execution status
Life time power on hours
Self-test failure check point
LBA of first failure
Vendor specific
...
Vendor specific
Self-test log pointer
Reserved
Data structure checksum
Note: N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes
long and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor.
The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there
are descriptor(s), the value is 1 through 21.

12.38.7 Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
specifications for byte ordering.
Byte
2
1
1
2
1
4
15
2
1
2
1
512
Travelstar 5K100 (Serial ATA) Hard Disk Drive Specification
Offset
00h
n*18h+02h
n*18h+03h
n*18h+04h
n*18h+06h
n*18h+07h
n*18h+08h
1FAh
1FCh
1FDh
1FFh
160