Figure 14.3A Diagram Of Multimode Baseplate Showing Location And Orientation Of; Electric Field Gradient Detection-Preparation - Veeco 004-210-000 Instruction Manual

Figure 14.3a Diagram of MultiMode baseplate showing location and orientation of jumpers
1. Carefully examine the following figures and identify which jumper configuration, if any, is
appropriate for your application.
2. Power down the NanoScope III controller and turn off all peripherals. Unplug the
NanoScope III power cable from the microscope's controller electronics box.
3. Ensure the tip is not engaged on the sample. Disconnect and remove the microscope head
and the scanner.
4. Carefully tilt the MultiMode so that the baseplate is oriented as shown in
Locate header and jumpers. As shipped from the factory, jumpers on systems without the
Basic Extender Module should appear as shown in
with the Basic Extender option should appear as in
used for EFM imaging in cases where voltage is applied to the tip or sample, it is necessary
to change the jumpers.
5. Depending upon whether voltage is to be applied to the tip or sample, and the amount of
voltage to be used, reconfigure jumpers on the baseplate header using the jumper
configuration as shown in the appropriate sections below.
6. After the jumpers are correctly configured, apply power to the microscope and all
peripherals. Boot the computer and start the NanoScope software.
7. If the jumpers are configured to use an external voltage source, click on the Microscope >
Calibrate > Detector option to display the Detectors Parameters window. Switch the
Allow in attenuation field to Allow.
8. Imaging can now be accomplished using the procedures in
Rev. B
Jumpers, inside baseplate
window
MultiMode SPM Instruction Manual
Electric Force (EFM) Imaging
Electric Field Gradient Detection—Preparation
Figure 14.3b, whereas jumper systems
Figure 14.3g. If the microscope is to be
Section 14.4.
Figure 14.3a.
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