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004-320-100
Veeco 004-320-100 Manuals
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Veeco 004-320-100 manual available for free PDF download: Manual
Veeco 004-320-100 Manual (455 pages)
Brand:
Veeco
| Category:
Industrial Equipment
| Size: 8.42 MB
Table of Contents
Table of Contents
2
Overview
14
System Overview
14
How to Reach Digital Instruments Veeco
15
Dimension 3100 SPM Features
16
System Overview
16
Control Station Overview
18
Figure 1.4A
18
Input and Display Devices
18
Computer
19
Figure 1.4B
19
Figure 1.4C
20
Nanoscope Iiia Controller
20
Dimension 3100 Controller
21
Figure 1.4D
21
Dimension 3100 Microscope Electronics Box1-10
23
Dimension 3100 SPM Overview
23
Figure 1.5A
23
Optics and Motors Overview
24
Dimension SPM Head
25
Figure 1.5B
25
Stage System
25
Figure 1.5C
27
Figure 1.5D
28
Cantilever Holder
29
Figure 1.5E
29
Figure 1.5F
30
Video Zoom Microscope
31
Facilities Specifications
32
Sample Size & Handling
32
Applications
33
Maintenance and Troubleshooting
33
Overview
34
Safety
34
Safety Requirements
35
General Operator Safety
36
Safety Precautions
36
Microscope
40
Sample Safeguards
42
Dimension 3100 SPM Facility Requirements2-11
44
Equipment Safety Applications
44
Ergonomics
44
Figure 2.6A
44
Non-Physical Conditions
44
Only)
45
Power-Up Sequence
45
Pre Power-Up Checklist
45
Power-Up the Dimension 3100 SPM (Service and Installation Only)
50
Power-Up Checklist (Service and Installation Only)
51
Power-Up Checklist (Normal Usage)
52
Power-Up Sequence (Normal Usage)
52
Prepare the System for Power-Up (Normal Usage)
52
Figure 2.9A
53
Select Windows NT Workstation 4.00
53
Software Power-Up
53
Figure 2.9B Log into Windows NT
54
Press CTRL - ALT - DELETE
54
Figure 2.9C Logon Window
55
Log on
55
Start the Nanoscope Software
55
Begin Stage Initialization
56
Select Real-Time
56
Figure 2.9F Status Panel
57
Software Power-Up Checklist
57
Figure 2.10B Laser Warning Label
58
Hazard Labels
58
Laser Warning Labels
58
Figure 2.10C Noninterlocked Protective Housing Label
59
Facilities Requirements
60
Overview
60
Axiom VT-103-3K with ELCON
61
Optional Configurations
61
Axiom IS3K-2
63
Figure 3.2C Axiom IS3K-2
63
Facilities Requirements
64
Figure 3.3A Dimension 3100 SPM Facility
64
Acoustic/Vibration Isolation Systems
65
Axiom IS3K-2 Dimensions, Utilities, and Clearance
65
Figure 3.4A Axiom IS3K-2
65
Figure 3.4B Axiom IS3K-2
66
Figure 3.4C Axiom IS3K-2
66
Axiom VT-103-3K Dimensions, Utilities and Clearance
68
Figure 3.4F Axiom VT-103-3K
68
Figure 3.4G Axiom VT-103-3K
69
Figure 3.4H Axiom VT-103-3K
69
Axiom VT-102 Dimensions and Utilities
70
Figure 287.3I: Axiom VT-102 Vibration Isolation Table
70
Computer/Controller Facility Requirements3-12
71
ELCON Console
72
Facilities Requirements Summary
73
Environmental Acoustic/Vibration Specifications
74
General Facilities Guidelines
75
Installation
76
Overview
76
Dimension 3100 Manual
77
Equipment Requirements
77
Shipping and Receiving
77
Uncrate the Dimension 3100 SPM System4-4
79
Uncrating the System
79
Install the Dimension 3100 SPM Unit
80
Installing the Dimension 3100 System
80
Install the Control Station
82
Connect the Dimension 3100 Control Station Extensions
84
Connecting the Dimension 3100 System
84
Figure 4.5A Computer (Rear View)
85
Figure 4.5D Dimension 3100 Controller
89
Figure 4.5E Dimension 3100 Controller
89
Connect the Dimension 3100 Microscope Extensions
90
Figure 4.5F D3100 Microscope Electronics Box
90
Figure 4.5G Vacuum Power Switch
91
Figure 4.5H Cable Clamp
91
System Power-Up
93
Overview
94
Stage System
94
Magnetic Pucks
95
Mounting of Samples
95
Vacuum Chucks
95
Axis Orientation-Motorized X-Y Stages
96
Load New Sample
97
Stage Menu Commands
97
Locate Tip
98
Figure 5.3C Locate Tip Prompt
99
Align Laser
100
Figure 5.3D Align Laser Prompt
100
Figure 5.3E Mirror Cap Prompt
100
Figure 5.3F Focus Surface Prompt
101
Focus Surface
101
Move to (X,Y)
102
Figure 5.3G Move to Prompt
103
Figure 5.3H Abort Motion Prompt
103
Figure 5.3I Set Reference Prompt
105
Set Reference
105
Figure 5.3J Defining the X-Axis
106
Programmed Move
108
Figure 5.3M Editing or Creating New Program
109
Figure 5.3N Teach Program Prompt
109
Figure 5.3O Teach Mode Prompt
110
Figure 5.3P Initial Focus Prompt
113
Initialize
113
SPM Parameters
115
Cantilever Preparation
116
Overview
116
Cantilever Preparation
117
Silicon Cantilever Substrates
117
Wafer Tool Kit
117
Tip Shape of Etched Silicon Probes
119
Silicon Nitride Cantilever Substrates
123
Tip Shape of Silicon Nitride Probes
126
Chapter 7 Head, Probe, & Sample Preparation
128
Overview
128
System Information
129
Mouse Versus Trackball
129
Motor Interlock
129
Laser Requirements
129
Basic AFM Operation
131
Select the Microscope Head
131
Select Mode of Operation
131
Prepare the Cantilever Holder
131
Load the Cantilever Holder
132
Remove the Dimension SPM Head
134
Install the Cantilever Holder
135
Replace the Dimension SPM Head
136
Connect the Dimension Head
136
Align Laser
136
Adjust Photodetector
141
Locate Tip
143
Load the Sample
144
Focus Surface
146
Cantilever Tune (Tappingmode Only)
146
Set Initial Scan Parameters
146
Engage
147
Establish Tip Clearance
147
Advanced AFM Operation
148
Stage Parameters
148
Contact AFM
150
Overview
150
Basic Contact Mode AFM Operation
151
Select the Microscope Head
151
Select Mode of Operation
151
Align Laser
151
Adjust Photodetector
152
Locate Tip
152
Focus Surface
152
Set Initial Scan Parameters
152
Engage
155
Advanced Atomic Force Operation
156
Cantilever Selection
156
Optimization of Scanning Parameters
159
Data Type
159
Gain Settings
160
Scan Size and Scan Rate
161
Setpoint
161
Lowpass Filter
162
Highpass Filter
162
Force Calibration Mode
163
Contact AFM in Fluids
164
Overview
164
Basic Principles of Contact AFM in Fluids9-2
165
Fluid Operation Hardware
165
Fluid Tip Holder
165
Tip Suggestions
166
Rubber Protective Skirt
167
Sample Mounting
167
General Notes on Sample Binding
167
Larger Samples
168
Smaller Samples
168
Fluid Operation Procedure
171
Load the Cantilever Substrate
171
Install the Cantilever Holder
172
Install the Protective Skirt
173
Align Laser
173
False" Reflections
173
Lower Tip Holder into Fluid
174
Readjust Laser Alignment
175
Adjust Detector Offsets and Setpoint
175
Locate Tip
176
Focus Surface
176
Check Scan Parameters
178
Engage
178
Adjust Scan Parameters
178
Clean Fluid Cell and Protective Skirt
179
Tapping Mode AFM
180
Overview
180
Principles of Tapping Mode
181
Basic Tapping Mode AFM Operation
183
Select the Microscope Head
183
Select Mode of Operation
183
Head, Cantilever and Sample Preparation10-4
183
Align Laser
183
Adjust Photodetector
184
Locate Tip
184
Focus Surface
184
Cantilever Tune
185
Set Initial Scan Parameters
189
Engage
191
Withdraw the Tip
192
Resonating Techniques
193
Cantilever Oscillation
193
Decreasing the Cantilever Drive Frequency10
195
Optimization of Scanning Parameters
196
Data Type
196
Gain Settings
197
Scan Size, Scan Rate, and Setpoint
197
Troubleshooting
199
Frequency Response Plot
199
Engaging the Sample
199
Tappingmode AFM in Fluids
201
Principles of Tapping Mode in Fluids
201
Acknowledgments
201
Precautions
202
Spillage Precautions
202
Basic Tapping Mode AFM in Fluids Operation
204
Select the Microscope Head
204
Select Mode of Operation
204
Align Laser
204
Adjust Photodetector
205
Locate Tip
205
Focus Surface
205
Cantilever Tune
206
Set Initial Scan Parameters
210
Engage
212
Clean the Fluid Cantilever Holder
212
Attach Protective Skirt
213
Plug Fluid Cell in Dimension Head
213
Prepare the Sample for Imaging
214
Remount the Dimension Head
214
Verify that the Microscope Is Dry
216
Switch to Tapping Mode
216
Set Initial Scan Parameters
225
Advanced LFM Operation
229
Optimal Setup for Frictional Measurements12-8
229
Identification of Friction
230
Identification of Forces Other than Friction12
233
Example of Frictional Data
235
Force Imaging
237
Force Plots-An Analogy
237
Force Calibration
240
Example Force Plot
241
Force Calibration Control Panels
245
Main Controls (Ramp Controls)
246
Main Controls (Display)
247
Channel 1, 2, 3 Panels
247
Feedback Controls
248
Scan Mode
250
Menu Bar Commands
252
Force Calibration (Contact Mode AFM)13-19
254
Obtaining a Good Force Curve
254
Helpful Suggestions
257
Advanced Techniques
260
Force Calibration (Tapping Mode)
265
Force Plots
265
Obtaining a Force Plot (Tapping Mode)13-33
268
High Contact Force
270
Plotting Phase Versus Frequency in Tapping Mode
271
Force Modulation
272
Introduction
272
Selecting a Force Modulation Tip
273
Operating Principle
274
Force Modulation Procedure
275
Notes about Artifacts
284
Force Modulation with 'Negative Liftmode'13
287
Set Interleave Controls
288
Obtain a Tapping Mode Image
288
Obtain a Negative Liftmode Force Modulation Image
289
Force Volume
291
Overview
292
Interleave Scanning
293
Basic Interleave Scanning Operation
293
Select the Microscope Head
293
Select Mode of Operation
293
Head, Cantilever and Sample Preparation14-3
294
Align Laser
294
Adjust Photodetector
294
Locate Tip
294
Focus Surface
295
Set Initial Scan Parameters
295
Engage
297
Lift Mode
298
Interleave Scanning/Lift Mode Operation14-8
298
Basic Lift Mode Operation
299
Advanced Lift Mode Operation
301
Lift Scan Height
301
Tip Shape
301
Scan Line Direction
301
Lift Mode with Tapping Mode
302
Main Drive Amplitude and Frequency Selection
302
Setpoint Selection
302
Interleave Drive Amplitude and Frequency Selection
302
Magnetic Force Microscopy
304
Overview
304
Magnetic Force Microscopy
305
Force Gradient Detection
305
Amplitude Detection Techniques
306
Basic MFM Operation
307
MFM Using Liftmode
307
Advanced MFM Operation
316
Lift Scan Height and Magnetic Imaging Resolution
316
Linear Lift
317
Fine Tuning Interleave Controls
317
Drive Amplitude
318
Installation of Extender Electronics Module15
321
Troubleshooting
325
MFM Image Verification
325
Saturation in Amplitude Detection
325
Optical Interference
325
Overview
326
Electric Techniques Overview
327
Electric Force Microscopy Overview
328
Surface Potential Imaging Overview
329
Electric Force Microscopy
330
Electric Force Microscopy Theory
330
Electric Force Microscopy Preparation
332
Surface Potential Detection
353
Surface Potential Detection Theory
353
Surface Potential Imaging Procedure
360
Open Loop Operation
364
Troubleshooting
366
Calibration
369
SPM Calibration Overview
369
Theory Behind Calibration
370
Sensitivity and Scanner Calibration
373
Scanner Properties
373
Calibration References
376
Small Scan Size Calibration
377
Full X-Y Calibration Routine
377
Linearity Correction
377
Off-Line / Utility / Autocalibration
392
Fine-Tuning for X-Y Calibration
395
Prepare System for Fine-Tuning
395
Measure Vertically at 440V Scan Size
397
Measure Vertically at 150 V Scan Size
400
Change Scan Angle and Repeat Calibration Routines
401
Calibrating Z
402
Engage
402
Capture and Correct an Image
403
Measure Vertical Features
405
Correct Z Sensitivity
407
Recheck Z-Axis Measuring Accuracy
408
Calculate Retracted and Extended Offset Deratings
408
Chapter 18 Maintenance and Troubleshooting
410
Overview
410
Maintenance
411
Returning Components for Repair
411
Cleaning the Cantilever Holder
411
Clean the Sample Holder and X-Y Stage Surfaces
411
Changing the Illuminator Light Bulb
412
Troubleshooting
414
Software Main Menu Items
414
Contact Mode AFM
417
Problems with Contact Mode AFM
419
Tapping Mode AFM
424
Problems with Tapping Mode AFM
428
Initialize
431
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