Magnetic Force (Mfm) Imaging - Veeco 004-210-000 Instruction Manual

Chapter 13 Magnetic Force (MFM)
This chapter describes how to perform Magnetic Force Microscopy (MFM) using the Interleave
and LiftMode procedures discussed in
MFM. Best results will be obtained with either the Digital Instruments Veeco Basic Extender
Module or the Quadrex Extender Module. These hardware units allows phase detection and
frequency modulation for optimal MFM imaging.
Specifically, this chapter discusses the following topics:
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Rev. B
Imaging
Magnetic Force Imaging Theory:
MFM Using Interleave Scanning and LiftMode:
• Procedure: Section 13.2.1
• Frequency Modulation:
Installation of the Extender Electronics Modules:
• Basic Extender: Section 13.3.1
• Quadrex Extender:
• NanoScope IV: Section 13.3.3
Software Setup Configuration (Basic, Quadrex or NSIV):
Troubleshooting Suggestions:
• MFM Image Verification:
• Saturation in Amplitude Detection:
• Optical Interference:
Advanced Topics: Section 13.6
• Lift Scan Height and Magnetic Imaging Resolution:
• Fine Tuning Interleave Controls:
MultiMode SPM Instruction Manual
Chapter 12. Please review those sections prior to attempting
Section 13.1
Section 13.2.2
Section 13.3.2
Section 13.5
Section 13.5.1
Section 13.5.2
Section 13.5.3
Section 13.6.2
Section 13.2
Section 13.3
Section 13.4
Section 13.6.1
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