Technical Data - KARL DEUTSCH LEPTOSKOP 2042 Instruction Manual

18 Technical Data

Display
Display type
Face
Acquisition of measuring data
Measuring method
Measuring performance
(continuous mode)
Measuring ranges
Calibration
Resolution
Measuring inaccuracy after two
point calibration on test blocks
2815.XXX
For probe types:
Standard probe Fe/NFe
Micro probe Fe/NFe
Standard probe special NFe
Instruction Manual LEPTOSKOP 2042
LCD graphics module 128 x 64 points
2
48 x 24 mm approx.
FE measuring:
magnetic-inductive procedure (DIN EN ISO 2178)
NFE measuring:
eddy current method (DIN EN ISO 2360)
1 reading per second approx.
Fe:
Standard probe: 0 - 3000 µm
Standard probe special: 500 µm – 20,000 µm
Micro probe: 0 - 500 µm
Two pole probe: 500 µm - 12500 µm
NFe:
Standard probe: 0 - 1000 µm
Standard probe special: 0 - 3750 µm
Micro probe: 0 - 500 µm
Zero, one point and two point calibration on un-
coated substrate, multiple point calibration, cali-
bration on coated substrate (if no uncoated mate-
rial is available) or default calibration
for coatings < 100 µm: 0.1 µm
for coatings < 1000 µm: 1 µm
for coatings < 10000 µm: 10 µm
for coatings > 10000 µm: 100 µm
Measuring inaccuracy depends on
1. substrate
2. calibration method
3. calibration points
... the following values are true:
coating < 100 µm: 1 % +/- 1 µm
coating > 100 µm: 1..3 % +/- 1 µm
coating > 1000 µm: 1..5 % +/- 10 µm
Art. No. 7423.421
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