Histogram Analysis; Troubleshooting - Texas Instruments ADS8353EVM-PDK User Manual

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6.7

Histogram Analysis

Histogram testing is commonly used when characterizing ADCs. A histogram is merely a count of the
number of times a code has occurred in a particular data set. The Histogram Analysis page of the GUI
creates a histogram of the data of the acquired data set and displays it.
Analysis page of the GUI.
The DC Analysis table shown in
• The StDev column displays the standard deviation of the data set. This value is equivalent to the RMS
noise of the signal when analyzing a dc data set.
• The Codes(pp) column shows the peak-to-peak spread of the codes in the data set; for a dc data set,
this range would be the peak-to-peak noise.
• The Mean column displays the average value of the data set.
• The ENOB(StDev) column displays the effective number of bits of the converter, as calculated from the
standard deviation or RMS noise.
• The Noise Free Bits column displays the effective bits of the converter when calculated using the peak-
to-peak noise.
6.8

Troubleshooting

If the ADSxx53EVM software stops responding while the ADSxx53EVM-PDK is connected, unplug the
USB cable from the EVM, unload the ADSxx53EVM-PDK software, reconnect the ADSxx53EVM-PDK to
the PC, and reload the ADSxx53EVM software.
When initially setting up the EVM, the software detects the EVM hardware, and loads the appropriate
hardware settings. If the EVM hardware is not detected, the GUI defaults to the Capture Mode: Software
Debug mode of operation using a preloaded captured data file for demonstration purposes.
SBAU210A – June 2014 – Revised August 2014
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Figure 29. Histogram Analysis
Figure 29 displays several parameters of the captured data set:
Copyright © 2014, Texas Instruments Incorporated
ADSxx53EVM-PDK Kit Operation
Figure 29 shows the Histogram
ADS8353EVM-PDK and ADS7853EVM-PDK
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