High Potential Test - HBM Genesis series Technical Note

4 Production tests
HBM public
GN610, GN611 Isolation and type testing
4.1

High potential test

The type tests are performed on a selection of cards to prove the design. Every
produced card will undergo a production test, to verify the correct construction
and safety of the card. The tests called "hipot" (high potential) tests (see
Figure 4.1 and Figure 4.2).
The test are performed in two steps to make sure the channels that are side by
side on the card can with stand the high potential voltages.
1 The inputs of channel 1, 3 and 5 are tested using a 1500 V RMS common
mode signal with ground attached to chassis ground and the inputs of
channel 2, 4 and 6 all connected to chassis ground.
2 The inputs of channel 2, 4 and 6 are tested using a 1500 V RMS common
mode signal with ground attached to chassis ground and the inputs of
channel 1, 3 and 5 all connected to chassis ground.
Figure 4.1: Hipot testing channels 1, 3 and 5
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