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11.23.4 Extended Self-test log sector
Table 159 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in
the SMART self-test log, defined in 11.51.6 Self-test log data structure on page 275 shall also be included in the
Extended SMART self-test log with all 48-bit entries.
Description
Self-test log data structure revision number
Reserved
Self-test descriptor index (7:0)
Self-test descriptor index (15:8)
Descriptor entry 1
Descriptor entry 2
...
Descriptor entry 18
Vendor specific
Reserved
Data structure checksum
Table 159 Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that
replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2,
etc. All unused self-test descriptors shall be filled with zeros.
11.23.4.1
Self-test log data structure revision number
The value of this revision number shall be 01h.
11.23.4.2
Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values for
the Self-test descriptor index are 0 to 18.
11.23.4.3
Extended Self-test log descriptor entry
The content of the self-test descriptor entry is shown below.
Description
Self-test number
Self-test execution status
Power-on life timestamp in hours
Self-test failure check point
Failing LBA (7:0)
Failing LBA (15:8)
Failing LBA (23:16)
Failing LBA (31:24)
Failing LBA (39:32)
Failing LBA (47:40)
Vendor specific
Table 160 Extended Self-test log descriptor entry
Western Digital Hard Disk Drive OEM Specification
Bytes
Offset
1
00h
1
01h
1
02h
1
03h
26
04h
26
1Eh
26
1D8h
2
1F2h
11
1F4h
1
1FFh
512
Bytes
Offset
1
00h
1
01h
2
02h
1
04h
1
05h
1
06h
1
07h
1
08h
1
09h
1
0Ah
15
0Bh
26
186
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