Defect Generation; Measurements - Wavetek ANT-20 Operating Manual
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- Operating manual (126 pages) ,
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- Operating manual (42 pages)
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Optical Interfaces; STM-0/1/4/OC-1/3/12
4.1.4
Defect generation
Drop &Insert
As specified in Sec. 1.3.10, Page S-6.
Through Mode
No direct defect generation is possible.
Tip: Alarms (defects) in the SOH/TOH can be generated by manipulating the SOH bytes.
4.1.5
Measurements
There are no restrictions on measurements. See Sec. 2.3, Page S-11.
S-18
Specifications STM-0/1/4/OC-1/3/12
ANT-20SE
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