Alarm Generator (Defects - Wavetek ANT-20 Operating Manual

Optical Interfaces; STM-0/1/4/OC-1/3/12

1.3.10 Alarm generator (defects)

The following defects can be generated in addition to those in the mainframe instrument:
.
Defect
-
LOS (optical)
LOF-622
RS-TIM (STM-4)
TIM-L (OC-12)
MS-AIS (STM-4)
AIS-L (OC-12)
MS-RDI (STM-4)
RDI-L (OC-12)
1 Included with options 3035/90.46, 3035/90.47 and 3035/90.48
Table S-3
The insertion of alarms (defects) or errors (anomalies) are mutually exclusive. The action
selected first is active.
S-6
Test sensor
function
On/Off
yes
yes
yes
yes
yes
Available defects in addition to the mainframe instrument
Test sensor thresholds
M in N
M = 800 to 7200
N = 1600 to 8000
M = 1 to N - 1
1
N = 1 to 8000
-
M = 1 to N - 1
N = 1 to 8000
M = 1 to N - 1
N = 1 to 8000
Specifications STM-0/1/4/OC-1/3/12
ANT-20SE
|---t1---|
|------t2------|
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
-
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s