Agilent Technologies 85110L User's And Service Manual page 17

General Information
Introduction
compatible sources (refer to "Contacting Agilent" on page iv). This system is suited for
making pulsed-RF measurements on one or two port devices. It provides the ability to
measure and display the relative magnitude and phase shift of the device as a function of
time or frequency. It may also make measurements on two port devices when it is
inconvenient to physically reverse the DUT (device under test) to measure all four
S-parameters. This is especially important for non-reciprocal devices or components like
transistors, amplifiers or isolators where S measurements are important.
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Figure 1-1 85110L RF Block Diagram
1-4 Agilent 85110L Test Set