Test Pattern For Ossd Testing; Test Pattern For Dynamic Input Testing - Omron G9SR Series Operation Manual

Operation manual

Test pattern for OSSD Testing

OSSD1
OSSD2
Ta
Ta < 250us
Tb < 350us
Ta = OSSD1 test pulse1 with a duration of <250 micro second
Tb = OSSD1 test pulse2 with a duration of <350 micro second
Tres = Cycle time of the complete G9SR unit
4.3

Test pattern for Dynamic Input testing

Test pattern with an input channel test pulse of 1 ms.
T11
T21
Tres = Cycle time of the complete G9SR unit
Ta Tb Tb
Tres
<1ms <1ms
Tres
G9SR
t
t
Page 13 of 79