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Page of SY31-0244-2
Revised December 1, 1971
By
TNL: SN31-0307
4.4 STROBE SETTING REOPTIMIZATION (24-32K-48K
DUAL BSM)
I.
Optimize low-address BSM (1st BSM at location OIA-
B4) as described in 4.3, with the switches set to test
only the lower (OIA-B4) BSM. (This BSM is either
l 6K or 32K depending on the total system memory
size.)
2.
Optimize high-address BSM (2nd BSM at location 01 A-
A4) as described in 4.3 using the program 97 option
which tests only the high BSM.
Do not go beyond -35V.
~
-
-
-
-
-
-
-
-
-
-
-
--35V
A
-------------
---
10 ns Strobe Increments
Figure 4-6. Optimization-Strobe and XYZ Drive Voltage
4.5 STROBE SETTING REOPTIMIZATION (64K DUAL
BSM; RPQ 840048)
1.
Optimize the low-address BSM (at location 01A-A4)
as described in Section 4.3 with the program switches
set to test 32K storage addresses.
2.
Jumper 01A-B3B2M08 to OIA-B3B2G03. This forces
'2nd BSM select' to the active level.
3.
Optiniize the high-address BSM (at location OIA-A4)
as described in Section 4.3 with the program switches
set to test 32K storage addresses.
4.
Remove the jumper added
in
step 2.
4-10
Optimum setting for XYZ drive
voltage and strobe setting is
recorded on a decal, which is
located on pin side of BSM.
This optimum setting can
change when a component
is replaced in a BSM.
Points where diagnostics fail.
Typical strobe timing.
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