Lucent Technologies SLC-2000 User & Service Manual page 152

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363-208-001
Operations and Maintenance Procedures (TOP)
Before You Start
Before you start turning up any SLC -2000 equipment, you must have a −48 V DC
power source, preferably with battery backup. If metallic distribution DLC DS0
services are required, you must have a ringing current power source. The
J1C182BD power plant is designed to meet the powering requirements for the
SLC -2000 equipment. Refer to document 640-250-296, JC182BD 20-Amp Bulk
Power Shelf, Turnup Procedure , to turn up this power equipment. Refer to
document 363-208-000, SLC-2000 Access System Applications, Planning, and
Ordering Guide , for information on power and ringing and how it is connected to
the system.
The First Step
Before you install any circuit packs in the SLC -2000 equipment, you must perform
the acceptance procedures to install fuses in the access resource manager
(ARM) shelf. Fuses for the metallic distribution shelf (MDS) assembly also can be
installed at this time. Then you must install the user interface panel complex
support circuit packs [see "ARM Shelf Turnup: NTP-010 (Release 3.1 and later) or
NTP-019 (Release 4.0 and later)"]. For systems with metallic feeder line interface
units (LIUs), use one of the following procedures:
Release 3.1, 3.2, or 3.3 (COT only). Arm Shelf Turnup: NTP-016
Release 4.0 or later. Arm Shelf Turnup: NTP-024.
The SONET Subsystem
The SONET subsystem is turned up with the optical lines looped back at the
OLIUs using one of the following procedures:
Release 3.1, 3.2, or 3.3 (COT only). ARM Shelf Turnup: NTP-011
Release 4.0 or later. Arm Shelf Turnup: NTP-020.
With the system looped back, tests should be performed to verify that function
groups A and C are working properly using one of the following procedures:
Release 3.1, 3.2, or 3.3 (COT only). ARM Shelf Turnup: NTP-014
Release 4.0 or later. Arm Shelf Turnup: NTP-022.
Other Subsystems
The ARM shelf also provides support for DS1 services, the DLC subsystem, and
an optional integrated test head (ITH) subsystem. The ITH subsystem provides
channel testing capabilities. Refer to document 363-208-000, SLC-2000 Access
System Applications, Planning, and Ordering Guide , for specific information
relating to the configurations that support the ITH subsystem. The ITH subsystem
4-10
Issue 9
April 1998
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