Lucent Technologies SLC-2000 User & Service Manual page 105

363-208-001
Product Description
Integral Test Head (ITH) Configurations
The ITH subsystem is an optional part of the SLC -2000 Access System that
allows direct test access by the mechanized loop testing (MLT) system using a
dial-up link to the ITH or local test access or both. The ITH circuit packs are
installed in the ARM shelf. The ITH circuit packs are not service affecting and are
not protected.
For MLT testing , the ITH is equipped with circuit packs as follows:
Power converter unit (PCU - BBF220)
Analog measurement unit (AMU - BBF221)
Power amplifier unit (PAU - BBF222)
Test head controller (THC - BBG220) with software for the ITH subsystem
Transmission signaling unit (TSU - BBF223).
For local test access , the ITH is equipped with circuit packs as follows:
Test head controller (THC - BBG220) with software for the ITH subsystem
Power amplifier unit (PAU - BBF222)
Craft access unit (CAU - BBF225).
NOTE:
If you are using the direct current (DC) bypass pair or the Tollgrade DC
bypass pair channel unit, you do not need the ITH for plain old telephone
service (POTS) testing.
2-52 Issue 9 April 1998
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