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APPLICATIONS
Semiconductor Sensor (Flexi) Probe
This external (EXT) range diffusion probe (Part No. 42200) is
designed to provide a faster speed of response in detecting
small fitting leaks, by eliminating the delay time taken by
the pump drawing the sample into the instrument analysing
chamber.
Fig. C-2 Semiconductor Sensor (Flexi) Probe
The probe sensor is located on the end of a flexible wand
and hence is able to gain access behind gas fittings
The high speed of response and the sensitivity of the
Semiconductor Sensor Probe also enables initial external
leakage surveys to be performed in the vicinity of both
domestic and industrial properties and pipelines, enabling
distribution leaks to be quickly found.
See application examples on following page.
C-3
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