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Chapter 7. Test Menu
Example:
1.
2.
3.
Pattern Result
Displays the results of the test currently active. Leaving and
returning to this menu item does not interrupt the test.
Press 2 to inject errors into the test pattern. These errors are
detected by the device performing the pattern check.
Clear results by pressing
until the test pattern is set to
Using TST DS0s for testing can be very useful, particularly in
Fractional T1 applications. You can run an end-to-end test on
the Fractional DS0s by:
1.
2.
7-6
Select QRSS ALL DS0s by using the
Press
to record the selection. The TSU 100 generates a
Enter
QRSS test pattern and inserts the pattern into all DS0s.
Select None to end the test.
ES
The number of seconds with at least 1 bit error.
BES
The number of seconds with more than 1 bit error
and less than 320.
The number of seconds with more than 320 bit
SES
errors.
SYNC
Indicates if pattern sync is (yes) or not (no) valid.
An asterisk (*) indicates if pattern sync has been
lost since the start of testing.
Setting for Map B the TST in the same DS0 as used by Map
A to receive data from an Nx/DBU port, and
By looping the far end using a V.54 loop-back code on the
Nx/DBU port (DBU is TSU 100e only).
TSU 100 User Manual
arrow keys
. The results are accumulated
Shift+9
or
None
Cleared
.
.
61202052L1-1
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