Section 11
Testing functionality by secondary injection
11.6.1.2
Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.6.2
Two step overvoltage protection OV2PTOV (59)
Prepare the IED for verification of settings as outlined in section
for test"
in this chapter.
11.6.2.1
Verifying the settings
Verification of single-phase voltage and time delay to trip for Step 1
1.
Apply single-phase voltage below the set value Pickup1.
2.
Slowly increase the voltage until the PU_ST1 signal appears.
3.
Note the trip value and compare it with the set value Pickup1.
For phase-to-ground measurement:
Vpickup
ANSIEQUATION2426 V1 EN-US
For phase-to-phase measurement:
Vpickup
ANSIEQUATION2427 V1 EN-US
4.
Decrease the voltage slowly and note the reset value.
5.
Set and apply about 20% higher voltage than the measured trip value for one phase.
6.
Measure the time delay for the TRST1 signal and compare it with the set value.
7.
Check the inverse time delay by injecting a voltage corresponding to 1.2 × Vpickup>.
8.
Repeat the test to check the inverse time characteristic at different over-voltage levels.
9.
Repeat the above described steps for Step 2 of the function.
11.6.2.2
Extended testing
1.
The tests above can be repeated for 2 out of 3 and for 3 out of 3 operation mode.
206
The trip value in secondary volts is calculated according to the following equations:
>
VBase
VT
sec
´
´
100
VTprim
3
>
VT
sec
´
´
VBase
100
VTprim
© 2017 - 2021 Hitachi Power Grids. All rights reserved
1MRK 504 165-UUS Rev. J
"Requirements"
and section
GUID-BE4B4A36-CCEE-4020-B7DC-6A83A43D11F5 v2
Transformer protection RET670
Commissioning manual
M13796-25 v5
M13806-2 v6
"Preparing
M13806-9 v2
M13806-50 v10
(Equation 103)
(Equation 104)