Wavelength Repeatability - Jasco V-530 Hardware/Function Manual

Scan. speed 200 nm/min
No. of Cycles 1
Lower scale -0.005 or more
Upper scale +0.005 Abs
(3) The baseline flatness is normal if the measurement result is within the
following criterion.
<V-530 criterion>
<V-550/560/570 criterion>

4.4.2 Wavelength Repeatability

Measure the spectrum of the deuterium(D
nm three times repeatedly to check its repeatability.
(1) Select [Envir] from the main menu to display the [Environment] menu.
(2) From the [Environment] menu, select [Other] to display the [Other] screen.
(3) Set the light source to [D2] (to light only the Deuterium lamp). (Refer to
Section 9-7 of the Operations manual.)
(4) Select [Single Beam] from the [Environment] menu to display the [Single
Beam] screen.
(5) Display the [Parameter] screen and set the following parameters.
V-530 measurement parameters
Phtmtrc mode Sam
Response Fast
Start WL 658 nm
End WL 654 nm
Data interval 0.1 nm
Scan. speed 40 nm/min
No. of Cycles 3
Lower scale 0
Upper scale 100
Note: PMT voltage
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Data interval
Scan. speed
No. of Cycles1
Lower scale
Upper scale
Within ±0.001 Abs (1000 200 nm)
Within ±0.001 Abs (850 200 nm)
2
V-550/560/570
parameters
Phtmtrc mode
Response
Band width
Start WL
End WL
Data interval
Scan. speed
No. of Cycles
Lower scale
Upper scale
HT Voltage
with instrument. Set accordingly.
varies
26
1.0 nm
200 nm/min
-0.005 or more
+0.005 Abs
) lamp with an emission line at 656.1
Sam
Fast
0.5 nm
658 nm
654 nm
0.025 nm
10 nm/min
3
0
100
300 V
measurement