JCK pin signal
JMS pin signal
Controller state
JDI pin signal
Input data to IR
IR shift register
Parallel output of IR
Input data to TDR
TDR shift register
Parallel output of TDR
Selected register
I n a c t i v e
JDO enable signal
JDO pin signal
Note TDR (Test Data Register): Boundary scan register and bypass register
Remark
: Don't care or undefined
314
CHAPTER 6 JTAG BOUNDARY SCAN
Figure 6-4. Operation of Test Logic (Instruction Scan)
Active
PRELIMINARY
B y p a s s
I n s t r u c t i o n r e g i s t e
I n a c t i v e
A c t i v e
N e w i n s t r u c t i o n
O l d d a t a
I n a c t i v e
NEC confidential and Proprietary