Agilent Technologies 93000 SOC Series Training Manual page 412

Lesson 1 – Test Method Structure
where,
: points to data to be accessed
DataCategory
Analog:Primary analog set (Currently-used analog module
conditions)
ANALOG(i):Existing analog set specified by a number (i)
Routing:For routing set or single routing setting
: points to analog module or routing hardware
Module
AWG:AWG (for Analog or ANALOG(i))
DGT:Digitizer or Sampler (for Analog or ANALOG(i))
TIA:TIA (for Analog or ANALOG(i))
pin:Analog pin of DUT (for Routing)
util:Utility line (for Routing)
: This depends on the Module
parameters
For AWG, DGT, and TIA of Analog or ANALOG(i),
: DUT pin name enclosed by double-quotes (").
Pin
: Only if one front-end module is occupied by two
coreNUM
TIAs, this is used to specify which TIA to access.
For the AWG, digitizer, or sampler, or if one front-
end module is occupied by one TIA, you do not
have to specify this parameter.
For pin of Routing,
: DUT pin name enclosed by double-quotes (").
Pin
For util of Routing,
Util_name: Utility line name defined in the pin configuration
: For Setup APIs, you can specify multiple functions with
func-n
comma ".". For Result APIs, only one item can be
specified.
The following are examples to set conditions of the digitizer
connected to Vout pin of the DUT:
Changing offset voltage to 0.5 V
•
Analog.DGT("Vout").vOffset(0.5 V);
Changing offset voltage to 0.5 V and voltage range to 5 V.
•
Analog.DGT("Vout").vOffset(0.5 V).vrange(5 V);
The following is an example to get the measurement data from the
digitizer connected to the Vout pin of the DUT:
Copying the measurement data to raw_data from the digitizer
•
412