Table 7. Sweep Speed And Sampling Interval - HP 54620A User's And Service Manual

Ensuring Accurate Measurements
Time base and Acquisition
The following table shows how the sampling intervals vary with sweep speed
when Auto Glitch Detect is enabled and disabled. The vernier function is off.
Table 7
Sweep Speed and Sampling Interval
Auto Glitch Detect
Enabled Disabled
Time/ Sample Sample
Div Period Period
5 s n/a 8 ms
2 s n/a 4 ms
1 s 8 ms 1.6 ms
800 µs
500 ms 4 ms
400 µs
200 ms 1.6 ms
800 µs 160 µs
100 ms
400 µs 80 µs
50 ms
160 µs 40 µs
20 ms
80 µs 16 µs
10 ms
Acquisition Memory
At sweep speeds from 1 s/div to 1 µs/div, the analyzer has acquisition
memory that is 16 bits wide and 2048 samples deep, and automatic glitch
detection is enabled. Part of the analyzer memory is consumed by automatic
glitch detection circuitry. When the sweep speed becomes faster than
1 µs/div, the glitch detection circuitry is disabled, and acquisition memory is
16 bits wide and 8192 samples deep. See "Glitch Detection" in this chapter
for more information.
Storage of Samples The following figure shows a conceptual
representation of acquisition memory. You can think of the trigger event
as dividing acquisition memory into a pre-trigger and post-trigger buffer.
The position of the trigger event in acquisition memory is defined by the
trigger reference point and the delay setting.
130
Auto Glitch Detect
Enabled Disabled
Time/ Sample Sample
Div Period Period
40 µs 8 µs
5 ms
16 µs 4 µs
2 ms
8 µs 1.6 µs
1 ms
500 µs 4 µs
800 ns
200 µs 1.6 µs
400 ns
100 µs
800 ns 160 ns
50 µs
400 ns 80 ns
20 µs
160 ns 40 ns
10 µs
80 ns 16 ns
Auto Glitch Detect
Enabled Disabled
Time/ Sample Sample
Div Period Period
5 µs
40 ns 8 ns
2 µs
16 ns 4 ns
1 µs
8 ns 2 ns
500 ns 4 ns 2 ns
200 ns 2 ns 2 ns
100 ns 2 ns 2 ns
50 ns 2 ns 2 ns
20 ns 2 ns 2 ns
10 ns 2 ns 2 ns
5 ns 2 ns 2 ns