HP 54620A User's And Service Manual page 233

Index
power requirements, 203
safety, 204–206
setup functions, 203
trigger system, 200
Performance Test Record, 178
record test results in, 177
verify voltage readings, 169
period measurement, 91
using cursors, 91
pivoting handle, 28
pixel memory, 58, 111
clearing, 116
recalling contents of, 115
saving trace waveform to, 114
poor uses for edge trigger, 65
poor uses for pattern trigger, 66
Position knob, 37, 50
position of cursors, 91
position of time reference
concepts, 133
in acquisition memory, 83–85
position of trigger event, 70
positioning channels, 50
positive width measurement, 91
post-trigger buffer, 70, 130
pouch, 24–26
power cord
connecting to analyzer, 27
disconnect before servicing, 181
remove before measuring voltages, 168
remove before servicing, 164–167
power requirements
performance characteristics, 203
power supply
adjusting voltages, 160–161
blown fuse, 168
hazardous voltages, 181
location of adjustments, 161
making dummy load, 158
measure fan voltage, 167
measure LVPS voltages, 168
measuring voltages, 161, 166
of circuit under test, 42–43
removing, 187
to adjust, 160–161
troubleshooting, 155
voltage measurements, 161
power switch, 27
232
power switch shaft
removing, 187
power-on, 27
self-test, 27
pre-trigger buffer, 70, 130
predefine test configurations, 112
predefined labels, 60–63
preset configuration, 119
print
cancel or stop, 88
interface modules used, 81
message, 212–213
status line, 81
waveform display, 81, 88
probe
attach every third ground, 142
circuit models, 140
grounding, 140
grounding concepts, 139–142
high-frequency circuit, 140
inductance, 141
loading concepts, 139–142
low-frequency circuit, 139–142
probe cable, 42–43
probe calibrator
performance characteristics, 203
probe leads
removing from cable, 43
probe tip design, 140
probes
connecting grabbers, 42–43
shorting together, 42–43
probing concepts
circuit under test, 139–142
probing practices, 142
problems
obtain HP service, 123
solving, 122
trace display, 123–124
with channels, 125
procedures
to test threshold accuracy, 169
to test time interval accuracy, 173
to verify correct operation, 150
process
acquisition, 70–71
pulse generator
connect to for test, 174
enabling to acquire data, 177
for testing time interval accuracy, 173
setting up, 175
pulse train
triggering on, 77
pulse transitions
of glitches, 143–148
Q
qualifiers
satisfy to trigger analyzer, 79
qualifying trigger pattern using external
trigger input, 108
R
rackmount kit, 24–26
rate of trigger outputs, 110
Re-ordering channels, 50
readout of cursors, 91
readout settings and indicators, 95
recall
configuration, 113
memory setup, 112
setup, 115–116, 118
trace memory, 111
trace waveform, 115
reconstructed waveform
for glitch capture, 144
record test results
in Performance Test Record, 178
reference point
for hold time measurement, 102
for setup time measurement, 100
relating channels and circuit signals, 40
relationship between key color and
function, 37
relationship of sweep speed and sample
periods, 48
relationships
timebase and analyzer, 129–138