Keithley S530 Manual page 55

Parametric test system, kte linear parametric test library
Hide thumbs Also See for S530:
Table of Contents

Advertisement

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Details
Some instruments are designed to be used with other instruments to provide complementary or
enhanced functionality to the other instrument. For example, some capacitance meters (CMTRs)
cannot generate bias voltages by themselves; they rely on a source-measure unit (SMU) to act as the
bias source.
This command closes relays on the HVM1212 matrix to connect the specified high-voltage SMU to
the bias tee connected to CMTR2. This allows the high-voltage SMU to bias a higher voltage than
that normally available from CMTR2.
This command works differently than it does on the S400 and S600 test systems. Linear Parametric
Test Library (LPTLib) code imported from these systems must be modified to accommodate
differences. For example, executing the forceV command (CMTR2, x) will have no effect; this is a
code compatibility issue for S400 and S600 code.
The devint command restores all instruments to normal operation.
Example
double capval;
conpin(CMTR2H, 1, 0);
conpin(CMTR2L, 2, 0);
insbind(HVGND, CMTR2L);
insbind(HVSMU1, CMTR2H);
forcev(HVSMU1, 1500);
measc(CMTR2, &capval);
devint();
Connects CMTR2 to pins 1 and 2 and binds HVSMU1 to CMTR2. HVSMU1 then biases voltage and
measures capacitance. The devint() command unbinds the instruments after the measurement is
made.
Also see
devint
(on page 3-26)
S530-900-01 Rev. E / September 2017
Section 3: LPTLib command reference
3-33

Advertisement

Table of Contents
loading

This manual is also suitable for:

S540

Table of Contents