Keithley S530 Manual page 112

Parametric test system, kte linear parametric test library
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Section 3: LPTLib command reference
Example
double resi[11], ssbiasv;
.
.
conpin(SMU1, 1, 0);
conpin(SMU2, 2, 0);
conpin(SMU3, 3, 0);
conpin(GND, 4, 0);
forcev(SMU3, ssbiasv); /* Apply substrate bias */
/* voltage ssbiasv. */
forcev(SMU1, -.1); /* Apply a gate-to-source */
/* voltage of -0.1 V. */
smeasi(SMU2, resi); /* Perform a series of current */
/* measurements; return */
/* the results to the array */
/* resi. */
sweepv(SMU2, 0.0, 5.0, 10, 2.5E-3); /* Generate */
/* 11 steps and 11 */
/* points each 2.5 ms duration, */
/* ranging from 0 V to 5V. */
This example gathers data to create a graph showing the common drain-source characteristics of a
field-effect transistor (FET). A fixed gate-to-source voltage is generated by SMU1. A voltage ramp from 0 V
to 5 V is generated by SMU2. Drain current applied by SMU2 is measured 11 times by the smeasi
command. Data is stored in the array resi.
3-90
S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
S530-900-01 Rev. E / September 2017

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