Keithley S530 Manual page 107

Parametric test system, kte linear parametric test library
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S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Example
double resi[13]; /*
.
.
conpin(SMU1, l, 0);
conpin(GND, 2, 0);
smeasi(SMU1, resi); /* Make a series of */
/* measurements; */
/* return the results to the */
/* resi array. */
sweepv(SMU1, 0.0, 0.3, 12, 25.0E-3); /* Make 13 measurements as the */
/* voltage ranges from 0 to */
/* 0.3V. */
This example determines the measurement data needed to create a graph showing the negative
resistance characteristics of a tunnel diode. SMU1 generates a voltage ramp ranging from 0 to 0.3 V. The
current through the diode is sampled 13 times with a duration of 25 ms at each step. The results are stored
in an array named resi.
Also see
clrscn
(on page 3-17)
devint
(on page 3-26)
sweepX
(on page 3-88)
S530-900-01 Rev. E / September 2017
Defines array. */
Section 3: LPTLib command reference
3-85

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