Nema Ts-2 Requirements - RuggedCom RuggedSwitch RS950G Hardware Installation Manual

5. Type Tests
Test
TS-2 1998, Section
2, para 2.2.7.3
TS-2 1998, Section
2, para 2.2.7.4
TS-2 1998, Section
2, para 2.2.7.5
TS-2 1998, Section
2, para 2.2.7.6
TS-2 1998, Section
2 para. 2.2.8.4
TS-2 1998, Section
2, para 2.1.10
TS-2 1992, Section
2, para. 2.1.6.1
TS-2 1998, Section
2 para. 2.1.6.2
TS-2 1998, Section
2, para 2.1.7
TS-2 1992, Section
2, para. 2.1.8
Table 5.4. NEMA TS-2 Requirements
RuggedCom® RuggedSwitch™
Description
Temperature: Low
Temperature/Low Voltage
Temperature: Low
Temperature/High Voltage
Temperature: High
Temperature/High Voltage
Temperature: High
Temperature/Low Voltage
Vibration Endurance Test
Mechanical Shock
Electrical Transients:
High Repetition
Noise (AC Terminals)
Electrical Transients:
Low-Repetition High
Energy (AC Terminals
Electrical Transients:
I/O Terminals
Electrical Transients:
Nondestruct Transient
Immunity (AC Terminals)
26
Levels
89.0 VAC @ -34°C
135.0VAC @ -34°C
135.0VAC @ + 75°C
89.0VAC @ + 75°C
0.5g @ 30Hz for 1hr
on all three planes
+/-10g half sine wave for
11msec on all three planes
One +/-300VDC pulse every
other cycle once every 3
seconds across 360 ° of
line cycle (2500W peak)
One +/-600VDC pulse
every second, randomly
distributed across 360 ° of
line cycle. Ten pulses total.
One +/-300VDC pulse
every second, minimum
5 pulses per port
One +/-1000VDC pulse
every two seconds,
3 per each polarity.
RS950G Installation Guide Rev 100
Performance Criteria
EUT Continued to function
properly during and
following all temperature
and humidity testing.
EUT Continued to function
properly during and
following all temperature
and humidity testing.
EUT Continued to function
properly during and
following all temperature
and humidity testing.
EUT Continued to function
properly during and
following all temperature
and humidity testing.
EUT functioned properly
following test procedure.
No physical damage.
EUT functioned properly
following test procedure.
No physical damage.
EUT functioned properly
during and following test
procedure. No damage.
EUT functioned properly
during and following test
procedure. No damage.
EUT functioned properly
during and following test
procedure. No damage.
EUT functioned
properly following test
procedure. No damage.