HP 330 Service Information Manual page 156

Memory Tests
Word Tests
Word (16 bit) wide tests are executed on main memory. There are two types of word wide tests
used. Tests on the upper 16K bytes and all peripherals always use the slower, walking ones
and zeros, test. The rest of main memory may use either the slow test, or a faster "address in
mernory" test.
Byte (8 bit) wide tests use the walking ones/zeros test. This test is used on any peripheral that
has less than full word wide memory (e.g. alpha display controller memory, and some graphics
memory).
These tests are faster than the same ones used with the Models 310 and 320. As the MC68020
ICACHE is enabled, there is a noticeable speed improvement.
The same messages are used for reporting all memory failures, but they are interpreted slightly
differently for word and byte memory tests.
For word wide memory test errors, the following message is displayed:
Memory Failed at AAAAAAAA
(W:BBCCDDEE. R:FFGGHHII)
This error message can be decoded as shown:
W: BBCCDDEE is the write pattern.
R: FFGGHHII is the read pattern.
BB and FF are at address AAAAAAAA.
CC and GG are at address AAAAAAAA + 1.
DD and EE are at address AAAAAAAA+2.
EE and II are at address AAAAAAAA+3.
For byte wide memory test errors, the following message is displayed:
Memory Failed at AAAAAAAA
(W:BBCCDDEE. R:FFGGHHII)
This error message can be decoded as:
W: BBCCDDEE is the write pattern.
R: FFGGHHII is the read pattern.
BB and FF are at address AAAAAAAA.
CC and GG are at address AAAAAAAA+2.
DD and EE are at address AAAAAAAA +4.
EE and II are at address AAAAAAAA+6.
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Boot ROM Functions