GE Reason H49 Technical Manual page 126

Technical Manual
Surge withstand capability
(SWC)
Surge Immunity
RF susceptibility tests
126
IEEE C37.90:2007 - B8
IEEE C37.90:2007 - B8
IEC 61000-4-5:2005
IEEE C37.90.2:2004 - B10
Power, Input/output,
CM Data com and signal
ports
TM Power and output ports
DM
AC/DC Power, Alarm,
binary Input/Output
Ports
CM
CM Signal ports
6 faces Enclosure ports
6 faces Enclosure ports
6 faces Enclosure ports
GE Reason H49
2,5kV crest value (tolerance
+0/–10%.)
2,5kV crest value (tolerance
+0/–10%.)
Level 4:
Source impedance 2Ω, Line-to-
line 2kV,
coupling resistor 0Ω, coupling
capacitance 18 µF
Level 4:
Source impedance 2Ω, Line-to-
earth 4kV,
coupling resistor 10Ω, coupling
capacitance 9 µF
Level 4:
Source impedance 2Ω, Line-to-
ground 4kV,
coupling resistor 40Ω, coupling
capacitance 0,5 µF
a) Field strength = 20 V/m (–0
to +6 dB) un-modulated
b) Sine wave amplitude
modulation, 80 % AM at 1 kHz
rate
c) Range of 80 MHz to 1000
MHz.
d) Spot frequency tests:
- 80, 160 and 450MHz ±0.5%
- 900MHz ±5 MHz
e) Dwell time >0,5s
a) Field strength = 10 V/m (–0
to +6 dB) un-modulated
b) Sine wave amplitude
modulation, 80 % AM at 1 kHz
rate;
c) Range of 1000 MHz to 3800
MHz with dwell time >0,5s and
frequency sweep test: 1%
d) Spot frequency tests:
- 1,6GHz and 3,8GHz with
dwell time >1s
a) Pulse modulated (50% duty
cycle) 8,5 V/m (–0 to +6 dB)
b) Range of 1000 MHz to 6000
MHz
d) Spot frequency tests:
- 1,732GHz
- 1,8GHz
- 2,31GHz
- 2,45GHz and 5,8GHz
e) Dwell time >1s
H49/EN M/C22