Glitch Energy (At Midscale Transition) Magnitude - National Instruments DAQ PCI E Series User Manual

Pci e series multifunction i/o boards for pci bus computers
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Appendix A
Specifications for PCI-MIO-16XE-50
Digital I/O
PCI E Series User Manual
Dynamic Characteristics
Settling time to ±0.5 LSB (±0.01%)
for full-scale step .............................. 50 µs
Slew rate ............................................ 2 V/µs
Noise.................................................. 40 µVrms, DC to 1 MHz
Glitch energy (at midscale transition)
Magnitude ................................... ±30 mV
Duration ...................................... 10 µs
Stability
Offset temperature coefficient ............ ±25 µV/°C
Gain temperature coefficient .............. ±15 ppm/°C
Number of channels ........................... 8 input/output
Compatibility ..................................... TTL/CMOS
Digital logic levels
Level
Input low voltage
Input high voltage
Input low current
Input high current
Output low voltage
(I
= 24 mA)
OL
Output high voltage
(I
= 13 mA)
OH
Power-on state.................................... Input (High-Z)
A-26
Min
Max
0 V
0.8 V
2 V
5 V
-320 µA
10 µA
0.4 V
4.35 V
© National Instruments Corporation

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