Figure 4-1.
Flow Chart of Knowledge-Based Reliability Evaluation Methodology
Establish the
market/expected use
environment for the
technology
Freeze stressing
requirements and perform
additional data turns
A detailed description of this methodology can be found at:
ftp://download.intel.com/technology/itj/q32000/pdf/reliability.pdf.
26
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
Develop Speculative
stress conditions based on
historical data, content
experts, and literature
search
Perform stressing to
validate accelerated
stressing assumptions and
determine acceleration
factors
§
Thermal/Mechanical Design Guide