OTM200
3.3.
Key System Features
Multiple traps with computer control
Adds trapping capabilities to existing inverted microscopes
Software user interface with enhanced mouse control of multiple time shared traps
Multiple trap pattern creation with arbitrary spacing – circles, lines, rectangles
IR laser with independent power control
Two independent trap paths with multiple time-shared traps per path
Active intensity stabilization of each trap beam with integrated noise eaters
Concurrent standard microscopy techniques like fluorescence
Compatible with major inverted microscope platforms
Fully enclosed beam path – Class 1 certified
Galvo-scanning beam control
SDK package
Upgradeable with force measurement module (sold separately)
Rev C, Oct 7, 2015
Chapter 3: Description
Page 6
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