Stop Position; Trap Position; Power And Cooling; Failure Detection, Indication, And Isolation - IBM 2025 Maintenance Manual

Processing unit
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TEST
GND
1403
PCH
RDR
FILE
1
2
0
0
0
0
0
0
0
0
SYNC
Figure 1-122. CE Panel
mode 6 and local storage zone 1 are
assigned for use with the 2560.
3
+OUT
0
0
AND
For local storage zone 1 to be altered
er displayed when it is being used for a
2560 operation, switch c must be set at the
latel 2311.
External rrode
f
cr 2560 can te
altered or displayed l:y setting switch C to
the label 2560.
1.23
C.E PANEL
The CE test panel (Figure 1-122) is located
on the A-gate back panei between beards Cl
and C2.
Some of the uses of the the panel are to
provide:
1.
Sync points for scoping.
2.
An
AND function for varicus diagnostic
purposes (scope sync, rronitcr, etc.).
3.
Capability to stop the system under
CE-selected conditions.
3.
Capability to stop the system under
CE-selected conditions,
4.
Capal:ility to trap into a reserved
microprogram area under CE-selected
conditions.
The plugs will accept either a banana
plug connector or a tare wire.
The sync portion of the CE test panel
has the following reeanings.
TEST:
This lamp is provided to check
status of latches, etc.
A +3V input to
A2E6B12 turns the lamp on.
~
(Ground}:
This plug is provided to
re du ce
l:
re aka g e of D 0 8 pins •
140l:
+3V print control
RDR:
+3V reader clutch
PCH:
+3V punch clutch
FILI:
+3V share cycle.
The AND huts provide a 3-way positive
input AND circuit with both plus and rrinus
outputs when the three inputs are positive.
Input lines Cl-IN, 2-IN. 3-IN) f lcat
positive when not plugged to a signal.
The
functions of the hubs are:
.L.m=
l....m=
Input to 3-la
y
positive AND
Input to 3-way positive AND
1-128 (7/69)
-OUT
0
GATE
OUT
IN
0
0
0
MATCH
COND
Input to 3-way positive AND
Positive AND plus output
Positive AND minus output.
The MA'ICH OU'I hub is positive at T7 time
when the storage-address register contents
match the setting of the console address
switches, and the MATCH GATE hub is
i;:ositive.
Because the address match
circuits are sarr.pled at T7, the
~ATCH
GATE
input must occur l:efore T7.
A positive pulse to the COND IN hub
causes either a stop or a trap depending on
the setting of the diagnostic control
switch.
1.23.1 STOP POSITION
A positive input pulse will stop the clock
and cause a hard stop.
1. 23. 2 TRAP POSITION
A positive input pulse will stop the clock
and cause a trap to control-storage address
0280.
A 64-byte area starting at address
0280 is reserved for CE rricroprograms.
This area allows the CE to enter
microprograms for diagnosing unusual or
intermittent failures that do not respond
to the primary microdiagnostic maintenance
strategy.
If desired, a rrcnitor
microprogram can l:e created and executed
without affecting the custorr.er problem
:r;:rogram.
The system stops every cycle if the
diagnostic control switch is placed in
either stop or trap positions without the
CCND IN hut teing wired ..
1.24 POWER AND COOLING
1.24.1 FAILURE DE'IECTION, INDICATION, AND
ISOLATION
The power system on the Model 25 features
comprehensive circuit protection and
failure detection facilities.
Each de
power supply has an overcurrent-sensing

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