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4 - 3.
SELF DIAGNOSTICS
The following <JescriiJes the displays produced for eacn
item in the verbose mode and the content of each self diag-
nostic test.
Where appropriate, the displays produced when
the special options available for each item are appended are
shown.
4 - 3 - 1 •
Main Memory Command
In the memory size test, the installed memory capacity
is determined and displayed.
All memory must be installed
with successive addresses.
Therefore, if there is a discrep-
ancy between the memory size displayed and the amount of
memory actually installed, there may be a problem with the
order
in
w!ncn tr1e memory was inserted.
In the data lines test, tne data signal lines are checked.
Data in whicn one oit is "l" and tne remaining 31 bits "0" is
written.
It is then read back and cnecked against the original.
In the byte access test, first a
55(16)
pattern is
written in byte access, and a check is performed to determine
if
it can oe read correctly.
Next, an
AAC16)
pattern is
written and read back as aoove as an additional check.
In tne word access test, first a
5555(16)
pattern is
written in word access, and a check is performea to determine
i i
it can ue read correctly.
Next, an
AAAA(l6)
pattern is
written and reaa oack as above as an additional cneck.
In the long access test, first a
55555555(16)
pattern is
written in long access, and a ci:1eck is performed to dete
rr.1i
ne
if
it
can be read
correctly.
Next, an l\/\AAA1\Al\
Cl
G)
pattern
is
written anu reau
0ack as
a0ove
as
a11
additional check.
4-6
NWS-1510/1530/1580
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