Double-Pulse Test Overview - Keysight Technologies PD1500A Software Manual

Introduction

Double-Pulse Test Overview

Keysight's PD1500A Double-Pulse Test (DPT) System uses a common test circuit
for characterizing power transistors. It enables the analysis of turn-on and
turn-off characteristics for supply voltages up to 1200 VDC and currents to 200
A.
The DPT system measures farther out in the I-V curve than standard IV/CV
device characterization (such as the PD1000A tests with the Keysight B1505A or
B1506A). For Wide Band Gap (WBG) devices, this means behavior at higher
voltage and current operating points can be accurately characterized. It can also
be used as a verification tool for the simulation results by showing the actual
switching curves.
The PD1500A Double-Pulse Test (DPT) system consists of multiple instruments
including the Keysight DSOS104A Oscilloscope, 33512B Waveform Generator, a
high voltage power supply, custom test fixture, etc. All instruments are
integrated into a test system and controlled from the PD1500A Control Software.
Both switching characterization (including reverse recovery) and derivation of
high power IV curves necessary for characterization are supported.
Figure 1shows a simplified schematic for the DPT tester. Two power transistors
are configured in a "half-bridge" configuration. The low-side transistor is the
actual device under test or DUT. For DPT operation the body-diode of the
high-side transistor is mandatory.
Calibration for the DPT system is done through software using tools provided as
part of the system. Each individual Keysight test instrument in the PD1500A
must be calibrated annually at a Keysight Service Center. Similarly, the coaxial
Shunt must be characterized annually.
During the DPT test, the four primary quantities of interest are the Drain-Source
Voltage (V
Gate Current (I
Source current is measured instead. In the DPT system this is done by integrating
a 10 m or optional 100 mCoaxial Shunt Resistor between the DUT transistor
source lead and V-. The voltage across this shunt resistor becomes the measure
for the current.
For FET devices, measurements are defined according to IEC 60747-8
For IGBT devices, measurements are defined according to IEC 60747-9
16
), the Drain Current (I
DS
). It is difficult to measure the Drain current. Therefore, the
G
Keysight PD1500A Double-Pulse Test System Software Guide
), the Gate-Source Voltage (V
D
Double-Pulse Test Overview
) and the
GS