Keysight Technologies PD1500A Software Manual
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Keysight Technologies PD1500A Software Manual

Dynamic power device analyzer/double-pulse tester
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Keysight PD1500A
Dynamic Power Device Analyzer/
Double-Pulse Tester
Provides detailed information to install, configure, and
use the PD1000A Control Software for PD1500A Double-
Pulse Test characterization measurements.
Manual applies to PD1000A Control Software
version 2022.321 and later, Test Fixture Firmware version
A.02.04 and later.
Control Software
Guide

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Summary of Contents for Keysight Technologies PD1500A

  • Page 1 Keysight PD1500A Dynamic Power Device Analyzer/ Double-Pulse Tester Provides detailed information to install, configure, and use the PD1000A Control Software for PD1500A Double- Pulse Test characterization measurements. Manual applies to PD1000A Control Software version 2022.321 and later, Test Fixture Firmware version A.02.04 and later.
  • Page 3 IS SUBJECT TO BEING CHANGED, without prior agreement and written con- WITHOUT NOTICE, IN FUTURE EDI- www.keysight.com/find/PD1500A sent from Keysight Technologies, Inc. as TIONS. FURTHER, TO THE MAXIMUM governed by United States and interna- EXTENT PERMITTED BY APPLICABLE (product-specific information and sup- tional copyright laws.
  • Page 4 Safety Information The following general safety precau- Do Not Operate Near Flammable Do Not Modify the Instrument Liquids tions must be observed during all Do not install substitute parts or per- phases of operation of these instru- Do not operate the instruments in the form any unauthorized modification to ments.
  • Page 5 Safety and Regulatory Symbols A CAUTION denotes a hazard. It calls attention to an operating pro- cedure or practice that, if not cor- The CE marking is a registered trade- rectly performed or adhered to, R-R-Kst-SP19629 mark of the European Community (if could result in damage to the accompanied by a year, it is the year South Korean Certification (KC) mark.
  • Page 6 Waste Electrical and German Portuguese Electronic Das Symbol der durchgestrichenen O símbolo da lata de lixo riscada indica Equipment (WEEE) Mülltonne auf Rädern weist darauf hin, que a necessidade da coleta seletiva dass eine getrennte Sammlung von dos resíduos de equipamentos eléctri- Elektro- und Elektronik-Altgeräten cos e electrónicos (REEE) é...
  • Page 7 Failure to comply with these precautions or with specific warnings elsewhere in this manual may impair the protections provided by the system. In addition, it violates safety standards of design, manufacture, and intended use of the system. Keysight Technologies assumes no liability for customer’s failure to comply with these requirements.
  • Page 8 • Instruments, probes or cables that appear damaged or defective should be made inoperative and secured against unintended operation until they can be repaired by qualified service personnel. Return the product to a Keysight Technologies sales or service office for service and repair to ensure that safety features are maintained.

  • Page 9: Table Of Contents

    DPT System PD1500A Tab ........
  • Page 10 PD1500A System Calibration ........51...
  • Page 11 Installation of Talenia Electronic PD1500-HHU1....119 Setting the Temperature in the PD1000A Control Software ... 119 Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 12 Problem: Inductor Not Connected Properly ......140 A Technique to Create an Accurate High-Power IV Curve ....141 1 Index Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 13: Introduction

    Host Computer System Requirements page 21 System Installation and Support page 21 The PD1500A Double-Pulse Test software is one part of the PD1000A Power Device Measurement System for Advanced Modeling Control Software. IMPORTANT: This version of the Software Guide applies to and describes features present in PD1000A Control Software version 2022.321 and later.

  • Page 14: Double-Pulse Test Overview

    Keysight DSOS104A Oscilloscope, 33512B Waveform Generator, a high voltage power supply, custom test fixture, etc. All instruments are integrated into a test system and controlled from the PD1500A Control Software. Both switching characterization (including reverse recovery) and derivation of high power IV curves necessary for characterization are supported.
  • Page 15 Double-Pulse Test Overview Introduction Figure 1 Simplified DPT Test Circuit Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 16: Test Equipment And Accessories Used In The Pd1500A

    Introduction Test Equipment and Accessories Used in the PD1500A Test Equipment and Accessories Used in the PD1500A The PD1500A Double-Pulse Test Solution includes several test instruments. These test instruments should have been installed by a Keysight-trained Application Engineer. – DPT Rack and Safety Enclosure (includes 2.5 m C19 power cord, unlocking tool, etc).
  • Page 17 1 Note: a minimum of one DUT module, one Gate Drive pair, and one Coaxial Current Shunt are required for the PD1500A. The Clamp Circuit module and the Device Heater Kit are not required. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 18: Pd1500A Double-Pulse Test Documentation

    PD1500 Test Rack and Safety Enclosure. PN: PD1500-90003 - PD1500A Si/SiC Test Fixture User Guide: Provides detailed information to install and use the Double-Pulse Test Modules for testing Si/SiC devices in the DPT Test Fixture. PN: PD1500-90004 - PD1500A System Installation Guide: Provides detailed information for Keysight personnel to install the Double-Pulse Rack and Safety Enclosure at a customer’s site.

  • Page 19: Host Computer System Requirements

    Hardware support (repairs and calibration) is provided separately for each of the individual test instruments in the system. In general, you should turn off the PD1500A system when it will not be used for long periods of time. This prevents a problem with the Heinzinger HV power supply.
  • Page 20 Introduction PD1500A Double-Pulse Test Documentation Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 21: Software Installation

    24 Download PD1000A Control Software page 24 Keysight IO Libraries is required to configure and control the system test instruments from the PD1000A Control Software. It is free software and available at: www.keysight.com/find/iosuite Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 22: Install Software On Host Pc

    Install Software on Host PC Install Software on Host PC To communicate with the PD1500A test equipment, Keysight I/O Libraries Suite must be installed on your host computer. IO Libraries Suite is a collection of libraries and utilities that enable you to connect your instruments to the host computer and run programs on the computer that interact with the instruments.
  • Page 23 However, after 30 days a permanent software license is required to continue running On State/Off State S-Parameter tests and DPT tests. For software and licensing information, go to: www.keysight/com/find/PD1500A. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 24 Software Installation Install Software on Host PC Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 25: Set-Up The Double-Pulse Test For Si/Sic Devices

    Connect the 10076C High Voltage Probe page 38 For detailed information on set up and using the Double-Pulse Test Solution Si/SiC Test Fixture, refer to the PD1500A Si/SiC Test Fixture Installation and Use Guide. For detailed information on using the PD1500A Double-Pulse Test Rack and Safety Enclosure, refer to the PD1500A Test Rack and Safety Enclosure Operation Guide.
  • Page 26 N2819A Differential N2873A 10:1 10076A High Voltage N2873A 10:1 Oscilloscope PD1000-60002 Oscilloscope Oscilloscope Probe Oscilloscope Probe 100:1 Oscilloscope Probe Probe Protection Probe Figure 3 Double-Pulse Test Diode Reverse Recovery Test Simplified Circuit Diagram Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 27 There are four capacitor banks: 800 F for 50 to 200 Vdc tests, 144 F for 200 t 400 Vdc 36 F for 400 to 880 Vdc 12 F for 880 to 1200 Vdc Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 28: Test Fixture Modules For Si/Sic Devices

    PD1000-66859 ±28 V, 44  Gate Resistor installed software version PD1000-66861 ±28 V, 200  Gate Resistor installed 2022.321 or Clamp Module PD1000-66505 DUT Module for TO-247 3-pin devices PD1000-60901 DUT Module for TO-247 4-pin devices PD1000-60902 Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 29 The ±28 V gate drive modules are equipped with single-path (common R ) gate resistors. PD1000-66848 and -6689 modules can be configured as either single-path or split path (separate R and R ) gate resistors. Each version has its own calibration procedure. G,ON G,OFF Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 30: Connect Probes To Dsos104A Or Mxr108A Oscilloscope

    CLAMP 2 Use the 0.56 N-m (5 lb-in) 5/16 in. SMA Break-over torque wrench (provided with the PD1500A system) to tighten the SMA cable connector to the PD1000-60002 Protection Probe. Failure to do so might cause extensive ringing in the DPT measurements. See appendix for details.
  • Page 31 CLAMP 2 Use the 0.56 N-m (5 lb-in) 5/16 in. SMA Break-over torque wrench (provided with the PD1500A system) to tighten the SMA cable connector to the PD1000-60002 Protection Probe. Failure to do so might cause extensive ringing in the DPT measurements. See appendix for details.
  • Page 32 Connect Probes to DSOS104A or MXR108A Oscilloscope The remaining four channels are unused. The MXR108A 8-channel oscilloscope can be used in future upgrades to the PD1500A Double-Pulse Test system. The oscilloscope channels and colors shown above are recommended. You may choose different channels. All examples and screen captures shown in the DPT documentation use this configuration.

  • Page 33: Connect Probes To The Double-Pulse Test Modules

    If you use the Clamp Circuit Module, do not install the N2819A Differential Probe. Instead, install one N2873A 10:1 Oscilloscope Probe connected to the Clamp Test Module (V ) probe socket. CLAMP Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 34 Standard N2873A Probe High Voltage 10076C Probe K-Thermocouple Connector Device Heater Jack Coaxial Shunt with PD1000-60002 Protection Probe cable Figure 7 Connecting Oscilloscope Probes to the Test Modules (Clamp Circuit Module not shown) Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 35: Using The N2787A 3D Probe Positioner

    3 Move the probe into place on the I pins of the Gate Drive Module. 4 Tighten the Central Positioning Knob of the Probe Positioner. Figure 8 Using the N2787A 3D Probe Positioner Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 36: Connect The 10076C High Voltage Probe

     High Voltage Probe shoulder Oscilloscope is against top Probe. of the socket Probe shoulder Probe Tip is not against Socket top of the socket Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 37: Double-Pulse Test Device Characterization Tests

    Testing GaN Devices This chapter is primarily concerned with testing Si or SiC devices using the standard PD1500A Si/SiC device Test Fixture and test modules. If you will be testing GaN devices, either HEMT, GIT or Cascode, contact your local Keysight Application Engineer for help in designing a customized test board for the PD1500A Test Solution.

  • Page 38: Obtain Oscilloscope Ip Address

    3 Locate the Web Interface field. In the example screen capture above, the correct web address to use is 156.140.93.168 for the DSOS104 Oscilloscope IP Address. Do NOT use the 192.168.25.2 address. 4 Record this address, it will be used later during the Hardware Setup. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 39: Settings In The Pd1000A Control Software

    Characterization data is saved with the following folder structure: Device > Model ID > Meas. Type > Voltages Tested > Currents Tested > Temperatures Tested > Date\Time > Test Data Files For example: Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 40: Hardware Configuration For Double-Pulse Test Control

    See “Hardware Configuration for Double-Pulse Test Control” on page 44 for detailed information. This menu has five tabs: – DPT System PD1500A: See “Hardware Configuration for Double-Pulse Test Control” on page 44. – Fixture: See “Fixture Tab” on page 46.

  • Page 41: Calibration & Compensation

    Modules,” starting on page 85 or the PD1000A Control Software Help File for additional information. Follow all on screen instructions. The PD1000A software must be connected to a PD1500A system for this selection. If it is not connected, an error occurs.

  • Page 42: Hardware Configuration For Double-Pulse Test Control

    Double-Pulse Test Device Characterization Tests Hardware Configuration for Double-Pulse Test Control Hardware Configuration for Double-Pulse Test Control DPT System PD1500A Tab DPT System Selection Selecting the DPT System PD1500A tab opens the following dialog: 1. Enter the oscilloscope’s IP Address from “Obtain Oscilloscope IP Address”...
  • Page 43 A.02.04-02-01 and is valid for this version of software. IMPORTANT: If you are using a laptop computer, turn the Wireless Network Connection off in the laptop before connecting to the PD1500A system. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 44: Fixture Tab

    Test Fixture VISA Address shows the firmware version of the PD1500A Test Fixture. The firmware version must be valid for the specific software version you are using. If it is not, refer to “Update PD1500A Test Fixture Firmware” on page 123.
  • Page 45 Inductor Settings With software version 2020.820 and later you have the option to use the standard, internal inductor (internal to the PD1500A Test Fixture) or an external, custom inductor. To use the internal inductor, leave the checkbox unchecked. If you choose to use an external inductor, check the Use Custom Inductor checkbox and enter the value of the inductor, in microHenrys (H), in the Custom Inductor...

  • Page 46: Oscilloscope Tab

    1 Due to limitations of the N2819A Differential Probe, occasional dropouts may lead to incorrect results in I current measurements. This can affect Gate Charge measurements. These dropouts occur only during measurements of very high current changes in the PD1500A system; for example when a small value inductor large currents and a very fast DUT.
  • Page 47 Bandwidth Limit Mode appears. For a detailed explanation, refer to the two Application Notes available in the PD1000A online help file: - Evaluating Oscilloscope Bandwidths for your Application - Understanding Oscilloscope Frequency Response and its Effect on Rise-Time Accuracy. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 48: Calibration Tab

    “not button. Figure 11 Hardware Configuration Calibration Tab Screen showing Gate Drive Low Board selected For complete descriptions of each sub-tab and fields, refer to the PD1000A Help file; see Calibration Tab Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 49: Measurement Preparation - Calibration & Compensation

    Channel 1 and sends a command to the oscilloscope to automatically calculate and set the channel-to-channel skew factor. Deskew should be performed anytime the ambient temperature changes ± 5 ° C. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 50: Coaxial Current Shunt De-Embedding

    Coaxial Shunt De-embedding is applied to the oscilloscope channel you specify for the Output Current. GaN devices require a special DUT Test Board and a software license. Contact Keysight for information. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 51: Standard Double-Pulse Characterization Test

    Low-Side Gate Drive Module. – 10076C 100:1 High Voltage Probe for measuring V on the DUT Module. – IMPORTANT: Remove the PD1000-66505 Clamp Module. Cycle power on the test system if necessary. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 52 Double-Pulse Test Device Characterization Tests Standard Double-Pulse Characterization Test 1. Select the Standard 2. Select device type (FET, IGBT, or GaN GaN devices require a special DUT Test Board and a software license. Contact Keysight for information. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 53: Clamped Double-Pulse Test

    ) devices. When installing or removing the PD1000-66505 Clamp Module, you must cycle power on the PD1500A test system in order for the change to be discovered. For detailed information about the Clamp Circuit Module and its use, refer to the PD1500A DPT Si/SiC Test Fixture and Modules Installation and Use Guide.
  • Page 54 Figure 13 PD1000A Control Software Screen for Clamp Double-Pulse Test The maximum test voltage that may be applied to the Clamp Circuit Module is 400 V. This for Si/SiC IGBT and FET devices. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 55: Reverse Recovery Test

    – IMPORTANT: Remove the PD1000-66505 Clamp Module. Cycle power if necessary. 1. Select the Reverse Tab 2. Select device type (FET, IGBT, or GaN Figure 14 PD1000A Control Software Screen for Reverse Recovery Test Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 56: Set Double-Pulse Test Parameters

    Double-Pulse Test Device Characterization Tests Set Double-Pulse Test Parameters Set Double-Pulse Test Parameters Many DUT test parameters can be obtained from the DUT data sheet. Figure 15 DPT Test Parameters Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 57: Gate Resistance

    Custom Inductor Value: Inductance: With software version 2020.820 (and later) you have the option to use the standard, internal inductor (internal to the PD1500A Test Fixture) or an external, custom inductor. Custom Inductor Value appears only if you have specified using a custom inductor in the Hardware Configuration > Fixture > Inductor Settings dialog.

  • Page 58: Dut Parameters

    “Unknown” is used. – Comments: Allows you to enter comments such as test details or DUT details. Comments are saved as part of the Measurement History and in the Parameters Results page. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 59 The Test Pulse is available only in Standard Test mode, not for Clamp and Reverse measurements. ° 1 Requires Software version 2020.820 or later. Ambient to +175 C for TO-247 device packages only; ambient to ° +150 C for SMD devices. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 60 Switching locus does not follow a standard. It shows output current over output voltage during the switching periods. The switching locus can be generated for any power transistor and the algorithm is independent from semiconductor material or device topology. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 61 When unchecked, the “Oscilloscope Capture” is not displayed or saved and can decrease the Double-Pulse Test time. – Clamp Voltage: (available only in Clamp DPT Test). Clamp voltage is fixed at and cannot be changed. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 62 Click the Refresh button ( ) to read the current temperatures. See “Using the Optional Device Heaters” on page 113 for a detailed description about using the device heater with the Double-Pulse Test Control Software. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 63: Clamp Output Screen

    R is measured at a certain time T DS,ON M,ON Unless you specify a t time under Additional Dynamic m,on Extraction, only one pulse is used for the R Clamp test. DS,ON Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 64: Measurement Parameters For Standard, Clamp, And Reverse Tests

    (e.g., > 1 mS). However, the pulse width must not be too long, otherwise, the measurement will be influenced by self-heating of the transistor. 200 nS is the minimum time. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 65: Output Voltage (V Ds Or V Ce )

    - Set the # of Points to: 7. This sets the Step Size to 50 V. - Then click Start to run the test. Also, see the Looping or Sweeping Multiple DPT Tests Note on page Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 66: Output Current (I Ds Or I Ce )

    38 and 42 A. Value must be greater than zero (0). 1 Values less than 10 A are possible but have not been tested. Current is limited by the energy in the capacitor. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 67: Run The Characterization Test

    Figure 16 Sample Double-Pulse Test Plot for a FET Device Test result data is automatically stored in the file specified in the Global Settings > Output Directory (see “Global Settings” on page 41). Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 68 If R is 0 Ohms. then the gate current cannot be measured. Waveforms from the PD1500A Double-Pulse Tests system are different from waveforms shown in various test standards. This is because of issues such as gate plateau, ringing due to parasitic inductances and capacitances, voltage drop due to stray inductances, overshoot, etc.

  • Page 69: Results Tab

    Comment Field on each Results Page Comments fields at the bottom of each Results page (Oscilloscope Capture, Gate Charge, Signal Levels and Time, etc.) are automatically saved. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 70: Measurement History Tab

    2 Click the down arrow next to Equals to select the type of filter to use. 3 Enter the parameter in the blank field. 4 Click Apply Filters. For example, if you want a list of all measurements made at 200 volts or greater: Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 71: Additional Features Of The Measurement History

    Select one or more tests from the Measurement History tab, right click to open the context menu, select Load Measurement(s)... to open the Results tab. Then click on the Selected Result down arrow to select one of the test results. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 72 PC-Based Oscilloscope Analysis Software. Refer to the Offline Software help file. 1 For FET devices, measurements are defined according to IEC 60747-8. For IGBT devices, measurements are defined according to IEC 60747-9. Refer to the PD1000A online help file for details. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 73 To delete a test from the Measurement History, delete the measurement from the output folder. The next time the Measurement History is loaded (or click Reload Measurement History) the test does not appear in the Measurement History. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 74: Frequently Asked Questions

    PD1000A online help file. How do I change the Gate Drive Resistor (R The PD1500A DPT system provides different Gate Drive Modules, each with a different value Gate Drive Resistor: – Isolated Low-Side Gate Drive Modules for Si/SiC devices.
  • Page 75 V , and C are measured with the PD1000A system using the Keysight B1505A or B1506A. Reverse Recovery parameters are measured with the PD1500A Double-Pulse Test Solution. What is the stray Inductance in the power loop circuits? approximately 38 nH.
  • Page 76 Double-Pulse Test Device Characterization Tests Frequently Asked Questions Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 77: Apd1500A System Specifications

    PD1500A System Specifications PD1500A System Specifications All PD1500A documentation and individual instrument documentation are available on-line. Refer to the individual Keysight instrument data sheets, user guides and help files for the latest specifications, operation, and use instructions as well as specific warranty and support information.
  • Page 78 Quality of the characteristic depends on the cleanliness of measured switching characteristics. d Gate Charge parameter extraction requires gate current monitoring. The quality of gate charge parameters depends on smoothness of measured curve. High Gate Resistance (e.g., 100 Ohms or larger) is recommended. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 79 200 A is the maximum system current; limited test voltage (see graph on next page) c Large values for Off-Time lead to significant loss of inductor current. This leads to limitations of parameter extraction. d Smaller values may be possible but are not recommended or tested. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 80 12 F (typical) at > 880 V Discreet Devices MOSFET, IGBT Silicon and SiC TO-247-3, TO-247-4, D2PAK7 Devices ° Temperature Control Heater Ambient temperature to 175 ° a TO-247 devices only; D2PAK devices limited to 150 Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 81 High-voltage disconnect, DC-Link capacitor discharged ° Over Temperature > 50 C (typical) Shutdown Interfaces 10/100/1000 Base T Ethernet a Safety hood cannot be opened at voltages > 42 V present in the system. Keysight PD1500A Double-Pulse Test System Software Guide...

  • Page 82: How To Use This Specification Chapter

    – Any graphs contain measured data from multiple units at room temperature and are representative of product performance within the controlled temperature range unless otherwise noted. – The data contained in this document is subject to change. Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 83 Double-Pulse Test Calibration for Si/SiC Modules Double-Pulse Test Calibration for Si/SiC Modules In this Chapter: General Purpose ±28 V Gate Drive Modules Calibration page 86 GaN Test Board Calibration page 86 Set/Verify AC Line Frequency & Date/Time on page 86 Begin Calibration &...

  • Page 84: Important - Calibration Information

    Double-Pulse Test Calibration for Si/SiC Modules General Purpose ±28 V Gate Drive Modules Calibration IMPORTANT – Calibration Information: Several calibration-related procedures should be performed: anytime changes are made to the PD1500A system. – Oscilloscope Probe Compensation. – System Calibration. – Oscilloscope Probe Deskew.

  • Page 85: Begin Calibration & Compensation

    Double-Pulse Test Calibration for Si/SiC Modules Begin Calibration & Compensation 1 Turn on the PD1500A Test System and allow it to warm-up for one hour. 2 Install the gate Drive modules that you will use in the Double-Pulse tests. The...

  • Page 86: Oscilloscope Probe Compensation

    Required Equipment All equipment required for compensation and calibration were provided with the PD1500A test system. This includes: – Spring hook and ground clips for passive oscilloscope probes. – 5 cm Extension Leads and either Pincer or Micro IC clips for the N2819A Differential probe.

  • Page 87: Offset Compensation For The N2819A Differential Probe

    Oscilloscope Probe Compensation Double-Pulse Test Calibration for Si/SiC Modules 4 Adjust so that the square wave on the oscilloscope screen looks square. Under Compensated Over Compensated Optimum Due to the 100:1 divider of the 10076C High Voltage Probe, the signal will appear to be very noisy. Therefore, it is beneficial to enable averaging in the Setup >...
  • Page 88 Double-Pulse Test Calibration for Si/SiC Modules Oscilloscope Probe Compensation 5 Set the oscilloscope to Averaging mode (Setup > Acquisition... > Averaging Enabled, x8 or higher) to reduce oscilloscope noise, if needed. 6 Set the vertical scale of the oscilloscope to 100 mV/div. 7 Using the offset adjustment tool that comes with the probe, adjust the probe offset voltage to zero volts.

  • Page 89: Si/Sic System Calibration Procedure (Autocal)

    Si/SiC System Calibration Procedure (Autocal) Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) Follow all on-screen instructions. Damage to the Test Modules is possible if instructions are not followed. IMPORTANT: After calibration and before running any Double-Pulse Test, make certain the Low-Side Gate Drive Modules have the V/NC jumper installed and the I/NO jumper removed.

  • Page 90: ±28 V Gate Modules

    Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) ±28 V Gate Modules Figure 19 Test Points used in the ±28 V Gate Module Calibration Module Initialization All Keysight gate drive modules except the PD1000-66848 Low-Side and PD1000-66849 High-Side gate drive modules come from the factory already calibrated.

  • Page 91: Gate Voltage Calibration - V

    Procedure: After setting up the hardware as described above, click Start to perform the calibration and continue to the Gate Voltage Source Calibration. A strip of 10 header jumpers (Keysight part number 1258-0225) were supplied with your PD1500A for use during calibration. Keysight PD500A Double-Pulse Test System Software Guide...

  • Page 92: Gate Voltage Calibration - V

    Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) Gate Voltage Calibration – V Probe: ±28 V Gate Drive Modules Use the following procedure for both Common-Path and Split-Path Gate Resistor configurations. Hardware Setup: ± – Connect the N2873A VGS/VGE Gate-Voltage-Probe into the V connector Deskew section of the Test Fixture.

  • Page 93: Modules

    Figure 22 Setup for Gate Voltage Calibration - Standard Gate Drive Modules Procedure: Click Start to perform the calibration and continue to next step. A strip of 10 header jumpers (Keysight part number 1258-0225) were supplied with your PD1500A for use during calibration. Keysight PD500A Double-Pulse Test System Software Guide...

  • Page 94: Modules

    Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) Gate Voltage Source Calibration – V Output: ±28 V Gate Drive Modules Hardware Setup: ± Use the following procedure for both Common-Path and Split-Path Gate Resistor configurations. – Connect the N2819A Differential Oscilloscope Probe to the I On Pins on the Low-Side Gate Driver Module.

  • Page 95: Gate Current Calibration - I G Probe: Standard Gate Drive Modules

    Figure 24 Setup for Gate Current Calibration - Standard Gate Drive Modules Procedure Click Start to perform the calibration and continue to the next step. A strip of 10 header jumpers (Keysight part number 1258-0225) were supplied with your PD1500A for use during calibration. Keysight PD500A Double-Pulse Test System Software Guide...

  • Page 96: Gate Current Calibration - I G Probe: ±28 V Gate Drive Modules

    Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) Gate Current Calibration – I Probe: ±28 V Gate Drive Modules Hardware Setup: ± Use the following procedure for both Common-Path and Split-Path Gate Resistor configurations. – Connect the N2819A Differential Oscilloscope Probe to the I Pins on G,ON the Low-Side Gate Driver Module.

  • Page 97: Gate On-Resistance Calibration - R G Value: Standard Gate Drive

    Si/SiC System Calibration Procedure (Autocal) Double-Pulse Test Calibration for Si/SiC Modules Gate On-Resistance Calibration – R Value: Standard Gate Drive Modules This step is required when installing custom gate resistors on the Low-Side Gate Drive modules. Hardware Setup: – Install the I/NO Jumper on the Low-Side Gate Drive Module. –...

  • Page 98: Gate On-Resistance Calibration - R G Value: ±28 V Gate Drive Modules

    Double-Pulse Test Calibration for Si/SiC Modules Si/SiC System Calibration Procedure (Autocal) Gate On-Resistance Calibration – R Value: ±28 V Gate Drive Modules Use the following procedure for Common-Path Gate Resistor configuration and for Split-Path RG,ON calibration. There is a separate procedure for RG,OFF Calibration for Split-Path Gate Resistor calibration (see next page).

  • Page 99: Gate Off-Resistance Calibration - R (Split-Path R G,Off )

    Si/SiC System Calibration Procedure (Autocal) Double-Pulse Test Calibration for Si/SiC Modules Gate Off-Resistance Calibration – R Value: ±28 V Gate Drive Modules (Split-Path R G,OFF Use the following procedure for Split-Path RG,OFF calibration only. There is a separate procedure for RG,ON Calibration for Split-Path Gate Resistor calibration. Hardware Setup: ±...

  • Page 100: High Voltage Probe Calibration - V

    – Install a High-Side Gate Drive Module (0  Gate Resistor) – Install a 1200 V FET (for example, the SCT2080KE FET supplied with the PD1500A) in the High-Side position of the DUT module. – Remove any FET in the Low-Side position of the DUT Module.

  • Page 101: Clamp Circuit Probe Calibration

    See Figure 30 below. ± – Install the PD1000-66805 Clamp Circuit Module in the PD1500A Test Fixture. If you are not using or calibrating the Clamp Module, press the Skip button to skip this step and proceed to the Protection Probe Calibration.

  • Page 102: Pd1000-60002 Protection Probe Calibration - I From Shunt

    – Connect the SMA end of the cable to the SMA connector on the PD1000-60002 Protection Probe. Use the 0.56 N-m (5 lb-in) 5/16 in. SMA Break-over torque wrench (provided with the PD1500A system) to tighten the cable to the PD1000-60002 Protection Probe.

  • Page 103: Oscilloscope Probe Deskew

    Oscilloscope Probe Deskew Double-Pulse Test Calibration for Si/SiC Modules Oscilloscope Probe Deskew Connect Probes to Deskew Fixture After the Oscilloscope Probe Compensation and System Calibration, the last step is to run Deskew. Deskew has the greatest impact on both On and Off Delay times and hence affects the total Switching Time.
  • Page 104 Double-Pulse Test Calibration for Si/SiC Modules Oscilloscope Probe Deskew 3 Connect the oscilloscope probes to the Deskew section of the Test Fixture. The N2873A V Probe CLAMP would connect here for N2819A I Differential Probe Deskew instead of the N2873A V Probe N2819A Differential Probe 10076A High Voltage V...

  • Page 105: Initializing Pd1000-66848 And -66849 Modules For Calibration

    Oscilloscope Probe Deskew Double-Pulse Test Calibration for Si/SiC Modules Initializing PD1000-66848 and -66849 Modules for Calibration The initialization procedure is very similar for both Common-Path and Split-Path configured modules. the following example shows the Split-Path initialization. Only the Keysight PD1000-66848 Low-Side and PD1000-66849 High-Side gate drive modules can be configured with split-path gate resistors (R ).
  • Page 106 Double-Pulse Test Calibration for Si/SiC Modules Oscilloscope Probe Deskew Initialize New Data EEPROMs for Split-Path Gate Drive Module If the module is a blank board (has never been Yes. initialized), click If it has been initialized before, click Enter the Nominal On-Resistance Value.
  • Page 107 Oscilloscope Probe Deskew Double-Pulse Test Calibration for Si/SiC Modules If the gate drive module is configured with Split-Path gate resistors, click . If it is configured a a Single- or Common-path, click Enter the Nominal Off-Resistance Value. In our example, enter Click Ok For maximum high voltage level, use the predefined...
  • Page 108 Double-Pulse Test Calibration for Si/SiC Modules Oscilloscope Probe Deskew For minimum low voltage level, use the predefined value (-28). Click Ok For maximum high-low voltage difference, use the predefined value (56). Click Ok For minimum high-low voltage difference, use the predefined value (1).

  • Page 109: Eeprom Values For Split-Path Gate Drive Modules

    Oscilloscope Probe Deskew Double-Pulse Test Calibration for Si/SiC Modules EEPROM Values for Split-Path Gate Drive Modules If a Low-Side gate drive board is configured with split-path output , there are the additional fields Customer Nominal Off Resistance and Customer Actual Off Resistance.

  • Page 110: Coaxial Shunt Resistor Characterization

    2 In the PD1000A Control Software, type the .tf2 file name into the Double-Pulse Measurement Control > Settings > Instrument Configuration > De-embedding File field. For new PD1500A systems, the de-embedding file was installed in the DSOS104 oscilloscope at the factory with the file name: MY5840xxxx.tf2...

  • Page 111: C Using The Optional Device Heaters

    1 Requires PD1000A Control Software version 2020.820 or later and Test Fixture Firmware A.01.03 or later. Ambient to ° ° +175 C is for TO-247 device packages only; ambient to +150 C for SMD devices. Keysight PD1500A Double-Pulse Test System...

  • Page 112: Configuring Temperature Control Settings

    Using the Optional Device Heaters Configuring Temperature Control Settings Hot Surface; DO NOT Touch! When the PD1500A device heater is used to heat the DUT, it becomes very hot. Do not touch the heater, clamp, or DUT. Do not allow flammable material (such as paper) to come into contact with the heater while it is hot.

  • Page 113: Activating The Heater And Setting Test Temperatures

    High-Side Device Heater” on page 117 for detailed information on installing and using the optional High-Side heater. When the heater/DUT temperature exceeds approximately 50  C, the large red light on the Test Fixture turns on. When the heater/DUT temperature exceeds approximately Keysight PD1500A Double-Pulse Test System...

  • Page 114: Adding Kapton (Polyimide) Tape To To-247-3 And -4 Devices

    - Tighten only enough to hold the DUT and heater assembly together. Do not over tighten. Early device clamps were made from aluminum. Later device clamps are made from PEEK material. Both clamps are functionally identical and may be used on Low-Side or High-Side devices. Keysight PD1500A Double-Pulse Test System...

  • Page 115: Using The Talenia Electronics High-Side Device Heater

    Low-Side device. Specify the operating temperature in the PD1000A control software. Two PD1000-62001 device heaters with integrated thermocouple are required -- one for the Low-Side device and one for the High-Side device. Keysight PD1500A Double-Pulse Test System...
  • Page 116 Low-Side and High-Side clamps do not touch. This has the potential of both High-Side and Low-Side device Drains touching. The newer PEEK material clamps do not have this problem. Aluminum clamps must not touch. Keysight PD1500A Double-Pulse Test System...

  • Page 117: Installation Of Talenia Electronic Pd1500-Hhu1

    Configuring Temperature Control Settings Using the Optional Device Heaters Installation of Talenia Electronic PD1500-HHU1 Connect extra PD1500A cable to back of device heater. Setting the Temperature in the PD1000A Control Software Talenia Model PD1500-HHU1 Specifications Keysight PD1500A Double-Pulse Test System...

  • Page 118: Device Heater Theory Of Operation

    (via a K-type thermocouple) and tries to regulate at the desired temperature. In the PD1500A, the temperature is sampled approximately 10 times per second. The heater itself has a theoretical capacity to heat itself at a rate up to 175  C per second.

  • Page 119: Heater Stability

    148.91 148.94 -1.06 Using the Device Heater There are two parts to configuring the PD1500A Device Heater: – Configuring the Temperature Control Settings. – Activating the (optional) Low-Side Heater and specifying Temperatures to test the DUT. If you want to use the heater and thermocouple, they must be connected to the Test Fixture before powering-up the PD1500A system.
  • Page 120 Using the Optional Device Heaters Device Heater Theory of Operation Table 2 lists several examples and expected results when using the PD1500A Heater and Thermocouple. It assumes the following test conditions: – Gate High Voltage: 18 V – Gate Low Voltage: -2 V –...

  • Page 121: D Update Pd1500A Test Fixture Firmware

    Update PD1500A Test Fixture Firmware Use the following procedure to update the firmware in the PD1500A Double-Pulse Test System Test Fixture. To prepare for this procedure, you must first download the firmware update (*.upd) file and the Keysight Firmware Update Utility to your local PC drive.
  • Page 122 Update PD1500A Test Fixture Firmware 4 Select the Hardware Configuration > Hardware tab to open the following dialog. Check Button used to verify communication with test instruments. 5 Click the Check button to verify that the Control software can communicate with all of the DPT system instruments.
  • Page 123 Update PD1500A Test Fixture Firmware When pressing the Check button *IDN? is sent to all the test instruments in the DPT system. If this is successful the instrument address turns green. Additionally, for the DPT Test Fixture the complete *IDN? response appears. This includes the serial number and circuit board revision codes.

  • Page 124: Firmware Update Process

    Update PD1500A Test Fixture Firmware Firmware Update Process When firmware updates become available, the update and an installation utility will be available at: www.keysight.com/find/PD1500A. 1 Install the Keysight Firmware Update Utility on your PC. 2 Download the latest firmware version to the host PC. Save the firmware file to a temporary location on the host PC.
  • Page 125 Update PD1500A Test Fixture Firmware When the utility finishes updating the firmware, the Test Fixture automatically reboots.
  • Page 126 Update PD1500A Test Fixture Firmware...

  • Page 127: Esma Connectors

    SMA Connectors SMA Connectors Good connections are essential for accurate calibrations and measurements and require a skilled operator. The most common cause of measurement error is poor connections. The following information is for use when connecting the two Waveform Generator cables to the DPT Test Fixture and when connecting the BNC-SMA cable to the PD1000-60002 Protection Probe.

  • Page 128: Final Connection Using A Torque Wrench

    Use a Keysight 8710-1582, 0.56N-m (5 lb-in) 5/16 inch break-over torque wrench to make a final connection. A Torque wrench is supplied as part of the PD1500A Accessory Kit. Figure 40 Keysight 8710-1582 SMA Torque Wrench The Keysight 8710-1582, 5 lb-in Torque Wrench is a precision instrument and should be treated and maintained like a measuring instrument.

  • Page 129: Separating Connections

    SMA Connectors 3 Hold the torque wrench lightly, at the end of the handle only (beyond the groove). See the following figure. Torquing Direction Stop when handle begins to yield Figure 42 Using the Torque Wrench 4 Apply force downward to the wrench handle. This applies torque to the connection through the wrench.

  • Page 130: Inspect And Clean Connectors

    SMA Connectors Inspect and Clean Connectors Clean connector interfaces prolong connector life and produce more accurate and repeatable measurements. When using SMA female connectors, pay special attention to the contact fingers on the female center conductor. These can be bent or broken, and damage to them is not always easy to see. A connector with damaged contact fingers will not make good electrical contact and must be repaired or replaced.

  • Page 131: F Measurement Tips And Troubleshooting

    – Heater not detected. Use of the heater/thermocouple is optional. However, they must be connected to the Test Fixture before powering-on the PD1500A system. Reboot the PD15000A if the heater is not detected. Waveforms from the PD1500A Double-Pulse Tests system are different from waveforms shown in various test standards.

  • Page 132: Typical Problems

    – Check the N2873A probe and connection to the Low-Side Gate Drive Module and ‘scope. – Ensure that only the V/NC jumper is installed on the Low-Side Gate Drive module. The I/NO jumper must be removed. Keysight PD1500A Double-Pulse Test System...

  • Page 133: Error Messages

    Problem: Error Message Occurs Solution: You are attempting to run a DPT but the Safety Hood is not closed and locked. Use the key provided with the PD1500A to lock the safety hood. Problem: No Drain-Source Current (I ) with sufficient Gate Drive (V...

  • Page 134: Problem: Drain Voltage

    ) did not resolve the problem. Solution: Coaxial Shunt not properly installed. The shunt bushing was not tight against the copper pad on the DUT Module. See PD1500A Test Fixture Guide or PD1500A System Installation Guide. Keysight PD1500A Double-Pulse Test System...

  • Page 135: Problem: Loose Shunt Resistor Connection

    This loose connection makes undesirable measurement results. Another typical faulty measurement result is for I to increase very rapidly exceeding the scale of scope. (green trace) increases too rapidly Keysight PD1500A Double-Pulse Test System...

  • Page 136: Problem: Error Related To Oscilloscope Channel 1

    Measurement Tips and Troubleshooting Error Messages Problem: Error related to Oscilloscope Channel 1 This error happens when ‘clamp’ tab is accidentally selected when a differential probe (N2819A) is attached to CH1. Problem: High-Side Device is Broken Keysight PD1500A Double-Pulse Test System...

  • Page 137: For Gan Devices

    DUT. To avoid this problem, apply negative voltage to the DUT in order to make sure the (low-side) DUT is off throughout the test and not affected by parasitic turn Keysight PD1500A Double-Pulse Test System...

  • Page 138: Problem: Inductor Not Connected Properly

    – When using external inductor, the inductor is not connected to load port but the following banana plug which is floating electrically. – Hand made inductor was disconnected at the joint because enamel was not removed when soldering. Keysight PD1500A Double-Pulse Test System...

  • Page 139: A Technique To Create An Accurate High-Power Iv Curve

    A Technique to Create an Accurate High-Power IV Curve In the graph below, the low voltage region was measured by B1506A and the high voltage region was measured by PD1500A. The following technique was used to put them together to create an accurate high-power IV curve.
  • Page 140 Measurement Tips and Troubleshooting A Technique to Create an Accurate High-Power IV Curve Keysight PD1500A Double-Pulse Test System...

  • Page 141: Index

    Characterization, Coaxial Probing Error Messages Shunt Expected Irrm Circuit Diagrams Export Raw Data Clamp Circuit Probe Extract Gate Charge Calibration Extract IV Curve Clamp Voltage IEC 60747-8 Extract RDS(ON) Clamped Double-Pulse IEC 60747-9 Test Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 142 Vclamp Calibration Oscilloscope Probe Operating Range Vds/Vce Calibration Oscilloscope Probe Safety Enclosure Hood Compensation Second On Time Oscilloscope Probe Select Columns Vgs Resolution Deskew Settling Time Vgs/Vge Probe Calibration simplified schematic, DPT VgsCalibration Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 143 Index Waveform Generator, 33512B Wide Band Gap (WBG)
  • Page 144 Index Keysight PD1500A Double-Pulse Test System Software Guide...
  • Page 146 This information is subject to change without notice. © Keysight Technologies, 2020-2022 Printed in Malaysia Fourth Edition, March 2022 *PD1500-90001* PD1500-90001 www.keysight.com...

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