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Implementation Results
3.3 Surge Immunity
V
500 V/DIV
LINE
V
20 V/DIV
INJ-C
V
10 V/DIV
SENSE1A
I
2 A/DIV
SENSE1A,1B
Figure 3-3. IEC 61000-4-5 Positive Surge, 6-kV Single Strike – 1 µs/div (a), 200 µs/div (b)
V
500 V/DIV
LINE
V
20 V/DIV
INJ-C
V
10 V/DIV
SENSE1A
I
2 A/DIV
SENSE1A,1B
Figure 3-4. IEC 61000-4-5 Negative Surge, 6-kV Single Strike – 1 µs/div (a), 200 µs/div (b)
V
500 V/DIV
LINE
V
10 V/DIV
SENSE1A
I
2 A/DIV
SEN1A,1B
I
10 A/DIV
INJ
Figure 3-5. IEC 61000-4-5 Surge, 6-kV Repetitive Strike at 10-Second Intervals – Positive (a), Negative (b)
12
Active EMI Filter Evaluation Module for Single-Phase AC Power Systems
INJ TVS diode clamps
SENSE internal
protection clamps
1 µs/DIV
(a)
INJ TVS diode clamps
SENSE internal
protection clamps
1 s/DIV
(a)
10 s/DIV
(a)
Copyright © 2023 Texas Instruments Incorporated
V
500 V/DIV
LINE
V
20 V/DIV
INJ-C
V
10 V/DIV
SENSE1A
I
2 A/DIV
SENSE1A,1B
(b)
V
500 V/DIV
LINE
V
20 V/DIV
INJ-C
V
10 V/DIV
SENSE1A
I
2 A/DIV
SENSE1A,1B
(b)
V
500 V/DIV
LINE
V
10 V/DIV
SENSE1A
I
2 A/DIV
SEN1A,1B
I
10 A/DIV
INJ
(b)
SLVUCK7A – NOVEMBER 2022 – REVISED JULY 2023
www.ti.com
Negative undershoot
eventually decays
INJ TVS diode clamps
SENSE internal
protection clamps
200 µs/DIV
Positive overshoot
eventually decays
INJ TVS diode clamps
SENSE internal
protection clamps
200 s/DIV
10 s/DIV
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